Scanning tunneling microscopy and spectroscopy on cracked surfaces of superconducting CeRu2

H. Sakata, N. Nishida, M. Hedo, K. Sakurai, Yoshihiko Inada, Y. Onuki, E. Yamamoto, Y. Haga

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Scanning tunneling microscopy and scanning tunneling spectroscopy measurements have been performed on a single crystal of CeRu2 down to 2.2 K under a magnetic field up to 2.0 T. The sample surfaces for the measurements are prepared by cutting or cracking the single crystal at 4.2 K. The vortex lattice has been imaged by mapping the quasi-particle density of states at the Fermi energy on the surface. We have observed that the surface has been covered with microstructures a few nm in diameter. These microstructures are characteristic of the surface when the sample is cut or cracked at low temperature.

Original languageEnglish
JournalApplied Physics A: Materials Science and Processing
Volume72
Issue number8
DOIs
Publication statusPublished - 2001
Externally publishedYes

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Scanning tunneling microscopy
scanning tunneling microscopy
Spectroscopy
spectroscopy
Single crystals
microstructure
Microstructure
single crystals
elementary excitations
Fermi level
Crystal lattices
Vortex flow
vortices
Magnetic fields
Scanning
scanning
magnetic fields
Temperature
energy

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)
  • Chemistry(all)

Cite this

Scanning tunneling microscopy and spectroscopy on cracked surfaces of superconducting CeRu2. / Sakata, H.; Nishida, N.; Hedo, M.; Sakurai, K.; Inada, Yoshihiko; Onuki, Y.; Yamamoto, E.; Haga, Y.

In: Applied Physics A: Materials Science and Processing, Vol. 72, No. 8, 2001.

Research output: Contribution to journalArticle

Sakata, H. ; Nishida, N. ; Hedo, M. ; Sakurai, K. ; Inada, Yoshihiko ; Onuki, Y. ; Yamamoto, E. ; Haga, Y. / Scanning tunneling microscopy and spectroscopy on cracked surfaces of superconducting CeRu2. In: Applied Physics A: Materials Science and Processing. 2001 ; Vol. 72, No. 8.
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