Scanning motions of an atomic force microscope tip in water

Kenichiro Koga, X. C. Zeng

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Integral equation techniques are used to study scanning motions of a single-atom tip of the atomic force microscope (AFM) over a rigid, hydrophobic monolayer substrate in water. The calculated force curve is found to be oscillatory, in agreement with recent AFM experiments, which can lead to multiple scanning trajectories for the tip under a constant load. The unique trajectory along which the system is thermodynamically stable is revealed. This study shows that the tip may take a hopping motion over a defect-free substrate due to layering of water molecules between the tip and substrate.

Original languageEnglish
Pages (from-to)853-856
Number of pages4
JournalPhysical Review Letters
Volume79
Issue number5
Publication statusPublished - 1997
Externally publishedYes

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microscopes
scanning
water
trajectories
integral equations
defects
curves
atoms
molecules

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Scanning motions of an atomic force microscope tip in water. / Koga, Kenichiro; Zeng, X. C.

In: Physical Review Letters, Vol. 79, No. 5, 1997, p. 853-856.

Research output: Contribution to journalArticle

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