TY - JOUR
T1 - Robust sandwiched fluorinated graphene for highly reliable flexible electronics
AU - Sahoo, Mamina
AU - Wang, Jer Chyi
AU - Nishina, Yuta
AU - Liu, Zhiwei
AU - Bow, Jong Shing
AU - Lai, Chao Sung
N1 - Funding Information:
This research was supported by the Ministry of Science and Technology, Taiwan ( 107-2218-E-182-006 , 107-2911-I-182-502 , NCRPD2HP011 ) and Chang Gung Memorial Hospital ( CMRPD2G0102 ).
Publisher Copyright:
© 2019
PY - 2020/1/1
Y1 - 2020/1/1
N2 - The high sensitivity of graphene to the surface condition of the gate dielectric layer and its poor van der Waals adhesion with a flexible substrate result in interfacial sliding and fracturing of graphene at low strains, making the successful utilization of pristine graphene (PG) in flexible electronics challenging. Here, we report a facile method for the fabrication of flexible graphene field effect transistors (F-GFETs) using sandwiched fluorinated graphene (FG). The “FG-PG-FG” sandwich structure shows a high optical transparency (>94%) with an average carrier mobility above 340 cm2/V·s, higher than that obtained when GO and Ion gel were used as gate dielectric materials on F-GFETs and a relatively low gate leakage current of ~160 pA. Furthermore, we observed a high mechanical stability, retaining >88% of the original current output against bending deformation of up to 6 mm and >77% after 200 bending cycles by applying a tensile strain of 1.56%, compared to the control sample. This improved performance is attributed to the fact that the sandwiched FG provides a good dielectric environment by tuning the C/F ratio, which tightly fixes the PG under strain. These findings provide a new route for the future development of graphene-based flexible electronics.
AB - The high sensitivity of graphene to the surface condition of the gate dielectric layer and its poor van der Waals adhesion with a flexible substrate result in interfacial sliding and fracturing of graphene at low strains, making the successful utilization of pristine graphene (PG) in flexible electronics challenging. Here, we report a facile method for the fabrication of flexible graphene field effect transistors (F-GFETs) using sandwiched fluorinated graphene (FG). The “FG-PG-FG” sandwich structure shows a high optical transparency (>94%) with an average carrier mobility above 340 cm2/V·s, higher than that obtained when GO and Ion gel were used as gate dielectric materials on F-GFETs and a relatively low gate leakage current of ~160 pA. Furthermore, we observed a high mechanical stability, retaining >88% of the original current output against bending deformation of up to 6 mm and >77% after 200 bending cycles by applying a tensile strain of 1.56%, compared to the control sample. This improved performance is attributed to the fact that the sandwiched FG provides a good dielectric environment by tuning the C/F ratio, which tightly fixes the PG under strain. These findings provide a new route for the future development of graphene-based flexible electronics.
KW - Bending
KW - CVD graphene
KW - Field effect transistor
KW - Flexible and transparent
KW - Sandwiched fluorinated graphene
KW - Strain
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U2 - 10.1016/j.apsusc.2019.143839
DO - 10.1016/j.apsusc.2019.143839
M3 - Article
AN - SCOPUS:85072089653
SN - 0169-4332
VL - 499
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 143839
ER -