Resonant Soft X-Ray Emission Spectroscopy of NiO across the Ni L2,3 Thresholds

Hirofumi Ishii, Yoichi Ishiwata, Ritsuko Eguchi, Yoshihisa Harada, Masamitsu Watanabe, Ashish Chainani, Shik Shin

Research output: Contribution to journalArticlepeer-review

29 Citations (Scopus)

Abstract

We study the electronic structure of NiO using resonant soft X-ray emission spectroscopy across the Ni L2,3 thresholds. We observe inelastic (Raman) features within 10eV of the elastic peak energy. At the L3 resonance, the features within 4eV are enhanced and can be directly assigned to the d-d multiplets of NiO, in correspondence to features observed in optical absorption spectra. Resonance enhancements of the triplet and singlet states resolved in energy confirm a spin-flip transition. Charge-transfer (CT) excitations are also clearly identified by resonance enhancement at photon energies corresponding to the satellites observed in the Ni L2,3 X-ray absorption spectra.

Original languageEnglish
Pages (from-to)1813-1816
Number of pages4
Journaljournal of the physical society of japan
Volume70
Issue number6
DOIs
Publication statusPublished - Jun 1 2001
Externally publishedYes

Keywords

  • Charge-transfer excitation
  • NiO
  • Raman
  • Resonant soft X-ray emission spectroscopy
  • Transition metal
  • d-d excitation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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