Resistance peak under a magnetic field parallel to the conducting plane

E. Ohmichi, H. Adachi, Y. Maeno, T. Ishiguro, T. Komatsu, G. Saito

Research output: Contribution to journalConference articlepeer-review

Abstract

In this study, an attempt was made to measure the sharp magnetoresistance peak for the two-dimensional conductors, κ-(BEDT-TTF)2Cu2(CN)3 and Sr2RuO4. It was found that the peak height depends on the orientation of the magnetic field within the conducting plane. The band calculation revealed that the calculated warping pattern is most prominent for the direction corresponding to the observed peak.

Original languageEnglish
Pages (from-to)1912
Number of pages1
JournalSynthetic Metals
Volume103
Issue number1-3
DOIs
Publication statusPublished - Jun 24 1999
Externally publishedYes
EventProceedings of the 1998 International Conference on Science and Technology of Synthetic Metals (ICSM-98) - Montpellier
Duration: Jul 12 1998Jul 18 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Resistance peak under a magnetic field parallel to the conducting plane'. Together they form a unique fingerprint.

Cite this