Reliability study on uni-traveling-carrier photodiode for a 40 Gbit/s optical transmission systems

T. Furuta; H. Fushimi; T. Yasui; Y. Muramoto; H. Kamioka; H. Mawatari; H. Fukano; T. Ishibashi; H. Ito

Reliability study on uni-traveling-carrier photodiode for a 40 Gbit/s optical transmission systems

T. Furuta, H. Fushimi, T. Yasui, Y. Muramoto, H. Kamioka, H. Mawatari, H. Fukano, T. Ishibashi, H. Ito

Research output: Contribution to conference › Paper › peer-review

Abstract

The reliability of InP/InGaAs uni-traveling-carrier photodiodes has been studied. A failure rate of 42 FIT at 25 C was obtained/from long-term bias-temperature tests. Stable operations for over 2000 h were also confirmed under high optical input conditions.

Original language	English
Pages	556-557
Number of pages	2
Publication status	Published - Dec 1 2001
Externally published	Yes
Event	27th European Conference on Optical Communications - Amsterdam, Netherlands Duration: Sept 30 2001 → Oct 4 2001

Other

Other	27th European Conference on Optical Communications
Country/Territory	Netherlands
City	Amsterdam
Period	9/30/01 → 10/4/01

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "Reliability study on uni-traveling-carrier photodiode for a 40 Gbit/s optical transmission systems",

abstract = "The reliability of InP/InGaAs uni-traveling-carrier photodiodes has been studied. A failure rate of 42 FIT at 25 C was obtained/from long-term bias-temperature tests. Stable operations for over 2000 h were also confirmed under high optical input conditions.",

author = "T. Furuta and H. Fushimi and T. Yasui and Y. Muramoto and H. Kamioka and H. Mawatari and H. Fukano and T. Ishibashi and H. Ito",

year = "2001",

month = dec,

day = "1",

language = "English",

pages = "556--557",

note = "27th European Conference on Optical Communications ; Conference date: 30-09-2001 Through 04-10-2001",

}

TY - CONF

T1 - Reliability study on uni-traveling-carrier photodiode for a 40 Gbit/s optical transmission systems

AU - Furuta, T.

AU - Fushimi, H.

AU - Yasui, T.

AU - Muramoto, Y.

AU - Kamioka, H.

AU - Mawatari, H.

AU - Fukano, H.

AU - Ishibashi, T.

AU - Ito, H.

PY - 2001/12/1

Y1 - 2001/12/1

N2 - The reliability of InP/InGaAs uni-traveling-carrier photodiodes has been studied. A failure rate of 42 FIT at 25 C was obtained/from long-term bias-temperature tests. Stable operations for over 2000 h were also confirmed under high optical input conditions.

AB - The reliability of InP/InGaAs uni-traveling-carrier photodiodes has been studied. A failure rate of 42 FIT at 25 C was obtained/from long-term bias-temperature tests. Stable operations for over 2000 h were also confirmed under high optical input conditions.

UR - http://www.scopus.com/inward/record.url?scp=0035741641&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035741641&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0035741641

SP - 556

EP - 557

T2 - 27th European Conference on Optical Communications

Y2 - 30 September 2001 through 4 October 2001

ER -

Reliability study on uni-traveling-carrier photodiode for a 40 Gbit/s optical transmission systems

Abstract

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ASJC Scopus subject areas

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