Radiation tolerance demonstration of high-speed scrubbing on an optically reconfigurable gate array

Takumi Fujimori, Minoru Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, field programmable gate arrays (FPGAs) are anticipated for use in high-radiation environments such as the Fukushima Daiichi nuclear power plant. According to recent news, regions with 650 Sv/h radiation have been found at the Fukushima Daiichi nuclear power plant. Under such extremely high radiation environments, high-speed scrubbing operations must be used to maintain correct circuit information on the configuration memory of programmable gate arrays. Up to now, optical high-speed scrubbing based on an optically reconfigurable gate array has been proposed. This paper presents a demonstration of the radiation tolerance of the optical high-speed scrubbing based on an optically reconfigurable gate array VLSI by using lasers that emulate strong radiation environments. It has been confirmed that 70-ns period high-speed scrubbing operations on the optically reconfigurable gate array are never disturbed by the emulated radiation.

Original languageEnglish
Title of host publicationProceedings - 30th IEEE International System on Chip Conference, SOCC 2017
EditorsJurgen Becker, Ramalingam Sridhar, Hai Li, Ulf Schlichtmann, Massimo Alioto
PublisherIEEE Computer Society
Pages91-95
Number of pages5
ISBN (Electronic)9781538640333
DOIs
Publication statusPublished - Dec 18 2017
Externally publishedYes
Event30th IEEE International System on Chip Conference, SOCC 2017 - Munich, Germany
Duration: Sep 5 2017Sep 8 2017

Publication series

NameInternational System on Chip Conference
Volume2017-September
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference30th IEEE International System on Chip Conference, SOCC 2017
Country/TerritoryGermany
CityMunich
Period9/5/179/8/17

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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