Radiation-degradation Analysis and a Circuit Performance Improvement Method for Optoelectronic Field Programmable Gate Array

Hirotoshi Ito, Minoru Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A radiation-hardened optoelectronic field programmable gate array (FPGA) consisting of a holographic memory, a laser array, and a standard CMOS process programmable gate array VLSI has already been developed. The optoelectronic FPGA provides soft-error tolerance and can withstand an over 1 Grad total-ionizing-dose. However, the degradation of the optoelectronic FPGA is not small and cannot be neglected. Propagation delay and power consumption increase along with increasing total-ionizing-dose. This paper presents the degradation measurement results of an optoelectronic radiation-hardened FPGA and a method to improve its performance.

Original languageEnglish
Title of host publicationProceedings - 32nd IEEE International System on Chip Conference, SOCC 2019
EditorsDanella Zhao, Arindam Basu, Magdy Bayoumi, Gwee Bah Hwee, Ge Tong, Ramalingam Sridhar
PublisherIEEE Computer Society
Pages306-311
Number of pages6
ISBN (Electronic)9781728134826
DOIs
Publication statusPublished - Sep 2019
Externally publishedYes
Event32nd IEEE International System on Chip Conference, SOCC 2019 - Singapore, Singapore
Duration: Sep 3 2019Sep 6 2019

Publication series

NameInternational System on Chip Conference
Volume2019-September
ISSN (Print)2164-1676
ISSN (Electronic)2164-1706

Conference

Conference32nd IEEE International System on Chip Conference, SOCC 2019
Country/TerritorySingapore
CitySingapore
Period9/3/199/6/19

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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