Radiated emission analysis of power bus noise by using a power current model of an LSI

Yukihiro Fukumoto, Osamu Shibata, Keisuke Takayama, Tomohiro Kinoshita, Zhi Liang Wang, Yoshitake Toyota, Osami Wada, Ryuji Koga

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.

Original languageEnglish
Article number89
Pages (from-to)1037-1042
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2
DOIs
Publication statusPublished - Jan 1 2002

Keywords

  • EMI
  • LSI
  • Power current model
  • Printed circuit board
  • Simulation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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