Abstract
In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.
Original language | English |
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Article number | 89 |
Pages (from-to) | 1037-1042 |
Number of pages | 6 |
Journal | IEEE International Symposium on Electromagnetic Compatibility |
Volume | 2 |
DOIs | |
Publication status | Published - Jan 1 2002 |
Keywords
- EMI
- LSI
- Power current model
- Printed circuit board
- Simulation
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering