Radiated emission analysis of power bus noise by using a power current model of an LSI

Yukihiro Fukumoto, Osamu Shibata, Keisuke Takayama, Tomohiro Kinoshita, Zhi Liang Wang, Yoshitaka Toyota, Osami Wada, Ryuji Koga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
Pages1037-1042
Number of pages6
Volume2
Publication statusPublished - 2002
Event2002 IEEE International Symposium on Electromagnetic Compatibility - Minneapolis, MN, United States
Duration: Aug 19 2002Aug 23 2002

Other

Other2002 IEEE International Symposium on Electromagnetic Compatibility
CountryUnited States
CityMinneapolis, MN
Period8/19/028/23/02

Fingerprint

large scale integration
decoupling
Inductance
electromagnetic noise
Capacitance
Radiation
inductance
modules
capacitance
evaluation
simulation

Keywords

  • EMI
  • LSI
  • Power current model
  • Printed circuit board
  • Simulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Fukumoto, Y., Shibata, O., Takayama, K., Kinoshita, T., Wang, Z. L., Toyota, Y., ... Koga, R. (2002). Radiated emission analysis of power bus noise by using a power current model of an LSI. In IEEE International Symposium on Electromagnetic Compatibility (Vol. 2, pp. 1037-1042)

Radiated emission analysis of power bus noise by using a power current model of an LSI. / Fukumoto, Yukihiro; Shibata, Osamu; Takayama, Keisuke; Kinoshita, Tomohiro; Wang, Zhi Liang; Toyota, Yoshitaka; Wada, Osami; Koga, Ryuji.

IEEE International Symposium on Electromagnetic Compatibility. Vol. 2 2002. p. 1037-1042.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fukumoto, Y, Shibata, O, Takayama, K, Kinoshita, T, Wang, ZL, Toyota, Y, Wada, O & Koga, R 2002, Radiated emission analysis of power bus noise by using a power current model of an LSI. in IEEE International Symposium on Electromagnetic Compatibility. vol. 2, pp. 1037-1042, 2002 IEEE International Symposium on Electromagnetic Compatibility, Minneapolis, MN, United States, 8/19/02.
Fukumoto Y, Shibata O, Takayama K, Kinoshita T, Wang ZL, Toyota Y et al. Radiated emission analysis of power bus noise by using a power current model of an LSI. In IEEE International Symposium on Electromagnetic Compatibility. Vol. 2. 2002. p. 1037-1042
Fukumoto, Yukihiro ; Shibata, Osamu ; Takayama, Keisuke ; Kinoshita, Tomohiro ; Wang, Zhi Liang ; Toyota, Yoshitaka ; Wada, Osami ; Koga, Ryuji. / Radiated emission analysis of power bus noise by using a power current model of an LSI. IEEE International Symposium on Electromagnetic Compatibility. Vol. 2 2002. pp. 1037-1042
@inproceedings{cc736ccc57ce42c2a15532d6979fade7,
title = "Radiated emission analysis of power bus noise by using a power current model of an LSI",
abstract = "In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.",
keywords = "EMI, LSI, Power current model, Printed circuit board, Simulation",
author = "Yukihiro Fukumoto and Osamu Shibata and Keisuke Takayama and Tomohiro Kinoshita and Wang, {Zhi Liang} and Yoshitaka Toyota and Osami Wada and Ryuji Koga",
year = "2002",
language = "English",
volume = "2",
pages = "1037--1042",
booktitle = "IEEE International Symposium on Electromagnetic Compatibility",

}

TY - GEN

T1 - Radiated emission analysis of power bus noise by using a power current model of an LSI

AU - Fukumoto, Yukihiro

AU - Shibata, Osamu

AU - Takayama, Keisuke

AU - Kinoshita, Tomohiro

AU - Wang, Zhi Liang

AU - Toyota, Yoshitaka

AU - Wada, Osami

AU - Koga, Ryuji

PY - 2002

Y1 - 2002

N2 - In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.

AB - In this paper, a power current model of an LSI, which was proposed at the last Symposium [5][6], was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.

KW - EMI

KW - LSI

KW - Power current model

KW - Printed circuit board

KW - Simulation

UR - http://www.scopus.com/inward/record.url?scp=0036383561&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036383561&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0036383561

VL - 2

SP - 1037

EP - 1042

BT - IEEE International Symposium on Electromagnetic Compatibility

ER -