Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

S. L. Johnson, P. A. Heimann, A. M. Lindenberg, Harald Olaf Jeschke, M. E. Garcia, Z. Chang, R. W. Lee, J. J. Rehr, R. W. Falcone

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77 Citations (Scopus)

Abstract

Time-resolved x-ray spectroscopy at the Si [Formula presented] edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.

Original languageEnglish
JournalPhysical Review Letters
Volume91
Issue number15
DOIs
Publication statusPublished - Jan 1 2003
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Johnson, S. L., Heimann, P. A., Lindenberg, A. M., Jeschke, H. O., Garcia, M. E., Chang, Z., Lee, R. W., Rehr, J. J., & Falcone, R. W. (2003). Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. Physical Review Letters, 91(15). https://doi.org/10.1103/PhysRevLett.91.157403