Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

S. L. Johnson; P. A. Heimann; A. M. Lindenberg; H. O. Jeschke; M. E. Garcia; Z. Chang; R. W. Lee; J. J. Rehr; R. W. Falcone

doi:10.1103/PhysRevLett.91.157403

Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

S. L. Johnson, P. A. Heimann, A. M. Lindenberg, H. O. Jeschke, M. E. Garcia, Z. Chang, R. W. Lee, J. J. Rehr, R. W. Falcone

Research output: Contribution to journal › Article › peer-review

83 Citations (Scopus)

Abstract

Time-resolved x-ray spectroscopy at the Si [Formula presented] edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.

Original language	English
Journal	Physical Review Letters
Volume	91
Issue number	15
DOIs	https://doi.org/10.1103/PhysRevLett.91.157403
Publication status	Published - 2003
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1103/PhysRevLett.91.157403

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abstract = "Time-resolved x-ray spectroscopy at the Si [Formula presented] edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.",

author = "Johnson, {S. L.} and Heimann, {P. A.} and Lindenberg, {A. M.} and Jeschke, {H. O.} and Garcia, {M. E.} and Z. Chang and Lee, {R. W.} and Rehr, {J. J.} and Falcone, {R. W.}",

year = "2003",

doi = "10.1103/PhysRevLett.91.157403",

language = "English",

volume = "91",

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T1 - Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

AU - Johnson, S. L.

AU - Heimann, P. A.

AU - Lindenberg, A. M.

AU - Jeschke, H. O.

AU - Garcia, M. E.

AU - Chang, Z.

AU - Lee, R. W.

AU - Rehr, J. J.

AU - Falcone, R. W.

PY - 2003

Y1 - 2003

N2 - Time-resolved x-ray spectroscopy at the Si [Formula presented] edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.

AB - Time-resolved x-ray spectroscopy at the Si [Formula presented] edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.

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DO - 10.1103/PhysRevLett.91.157403

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VL - 91

JO - Physical Review Letters

JF - Physical Review Letters

IS - 15

ER -

Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

Abstract

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