Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

H. Michinishi, Tokumi Yokohira, T. Okamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT.

Original languageEnglish
Title of host publicationATS 1993 Proceedings - 2nd Asian Test Symposium
PublisherIEEE Computer Society
Pages14-19
Number of pages6
ISBN (Electronic)081863930X
DOIs
Publication statusPublished - Jan 1 1993
Event2nd IEEE Asian Test Symposium, ATS 1993 - Beijing, China
Duration: Nov 16 1993Nov 18 1993

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Conference

Conference2nd IEEE Asian Test Symposium, ATS 1993
CountryChina
CityBeijing
Period11/16/9311/18/93

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Michinishi, H., Yokohira, T., & Okamoto, T. (1993). Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs. In ATS 1993 Proceedings - 2nd Asian Test Symposium (pp. 14-19). [398773] (Proceedings of the Asian Test Symposium). IEEE Computer Society. https://doi.org/10.1109/ATS.1993.398773