Proof that Akers'' Algorithm for Locally Exhaustive Testing Gives Minimum Test Set of Combinational Circuits with up to Four Outputs

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)14-19
Number of pages6
JournalProc. Second Asian Test Symposium (ATS ''93)
Publication statusPublished - 1993

Cite this

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title = "Proof that Akers'' Algorithm for Locally Exhaustive Testing Gives Minimum Test Set of Combinational Circuits with up to Four Outputs",
author = "Tokumi Yokohira",
year = "1993",
language = "English",
pages = "14--19",
journal = "Proc. Second Asian Test Symposium (ATS ''93)",

}

TY - JOUR

T1 - Proof that Akers'' Algorithm for Locally Exhaustive Testing Gives Minimum Test Set of Combinational Circuits with up to Four Outputs

AU - Yokohira, Tokumi

PY - 1993

Y1 - 1993

M3 - Article

SP - 14

EP - 19

JO - Proc. Second Asian Test Symposium (ATS ''93)

JF - Proc. Second Asian Test Symposium (ATS ''93)

ER -