Precise frequency-drift measurement of extended-cavity diode laser stabilized with scanning transfer cavity

Kensuke Matsubara, Satoshi Uetake, Hiroyuki Ito, Ying Li, Kazuhiro Hayasaka, Mizuhiko Hosokawa

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

A simple and effective method for stabilizing laser frequencies using scanning transfer cavities and a stabilized helium-neon laser was applied to extended-cavity diode lasers near 866 nm and 397 nm. The frequency drift of the stabilized 866 nm laser measured using an optical frequency synthesizer was smaller than 200 kHz for 1 h. The square root of the Allan variance was 1 × 10-10 at an averaging time of 103 s.

Original languageEnglish
Pages (from-to)229-230
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume44
Issue number1 A
DOIs
Publication statusPublished - Jan 1 2005
Externally publishedYes

Keywords

  • Calcium ion
  • Extended-cavity diode laser
  • Frequency stabilization
  • Optical frequency standard
  • Optical frequency synthesizer

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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