Power current modeling of IC/LSI with load dependency for EMI simulation

Hideki Osaka, Osami Wada, Tomohiro Kinoshita, Yoshitaka Toyota, Daisuke Tanaka, Ryuji Koga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

Abstract

In this paper, we described how we modeled EMI noise from the power-pin current of an LSI that has two ports: a power-ground port and a driver output port. We named this modeling the "Linear Equivalent Circuit and Current Source for I/O (LECCS-I/O)" model and with it measured power current and power-ground impedance for various combinations of loading capacitances and decoupling inductances using a small scale IC (74LVC04). Results showed that up to 500 MHz, the LECCS-I/O model could predict peak and valley frequencies of the power current where the error was within 2.5 MHz, and where the peak current error was less than 5 dB. The application range of the LECCS-I/O model is valid where the non-overlap duration of the dumping oscillation wave between cycles is longer than twice the time constant of the waveform.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
Pages16-21
Number of pages6
Volume1
Publication statusPublished - 2003
Event2003 IEEE Symposium on Electromagnetic Compatibility - Boston, MA, United States
Duration: Aug 18 2003Aug 22 2003

Other

Other2003 IEEE Symposium on Electromagnetic Compatibility
CountryUnited States
CityBoston, MA
Period8/18/038/22/03

    Fingerprint

Keywords

  • Driver
  • EMI simulation
  • Impedance
  • LECCS
  • Loading depandency
  • PCB
  • Power-pin current

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Osaka, H., Wada, O., Kinoshita, T., Toyota, Y., Tanaka, D., & Koga, R. (2003). Power current modeling of IC/LSI with load dependency for EMI simulation. In IEEE International Symposium on Electromagnetic Compatibility (Vol. 1, pp. 16-21)