Abstract
In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.
| Original language | English |
|---|---|
| Pages (from-to) | 19-24 |
| Number of pages | 6 |
| Journal | Microelectronics Reliability |
| Volume | 85 |
| DOIs | |
| Publication status | Published - Jun 2018 |
| Externally published | Yes |
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Keywords
- High accelerated limit test
- Operational amplifier circuit board
- Potential failure mode
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
Cite this
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test. / Sakamoto, Junji; Hirata, Ryoma; Shibutani, Tadahiro.
In: Microelectronics Reliability, Vol. 85, 06.2018, p. 19-24.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test
AU - Sakamoto, Junji
AU - Hirata, Ryoma
AU - Shibutani, Tadahiro
PY - 2018/6
Y1 - 2018/6
N2 - In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.
AB - In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.
KW - High accelerated limit test
KW - Operational amplifier circuit board
KW - Potential failure mode
UR - http://www.scopus.com/inward/record.url?scp=85045249229&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85045249229&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2018.04.005
DO - 10.1016/j.microrel.2018.04.005
M3 - Article
AN - SCOPUS:85045249229
VL - 85
SP - 19
EP - 24
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
ER -