Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test

Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this study, the potential failure modes of a small operational amplifier circuit board were investigated. The high accelerated limit test (HALT) was employed to identify the failure modes under multi-axial vibration and temperature loadings. Five stress tests, specifically, low and high temperature, vibration, thermal shock, and composite profiles were performed. An aluminum electrolytic capacitor was damaged under the low temperature process, whereas the capacitance of a ceramic capacitor decreased under the high temperature process. The vibration test revealed that mechanical fatigue occurs at the terminal leads of aluminum electrolytic capacitors. The HALT also revealed coupled effects between high and low temperature processes and vibration.

Original languageEnglish
Pages (from-to)19-24
Number of pages6
JournalMicroelectronics Reliability
Volume85
DOIs
Publication statusPublished - Jun 2018
Externally publishedYes

Keywords

  • High accelerated limit test
  • Operational amplifier circuit board
  • Potential failure mode

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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