Potential barriers to electron carriers in C60 field-effect transistors

Atsushi Konishi, Eiji Shikoh, Yoshihiro Kubozono, Akihiko Fujiwara

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Transport properties of C60 field-effect transistors (FETs) have been investigated in the temperature range between 160 and 300 K. Activation energy was estimated from temperature dependence of resistance at the linear region and of current at the saturation region for various channel lengths. Variation of activation energy values is attributed to carrier injection barrier at contact between source electrode and C60 channel, and barriers to carrier hopping between trap states in the channel of C60.

Original languageEnglish
Article number173302
JournalApplied Physics Letters
Volume92
Issue number17
DOIs
Publication statusPublished - May 9 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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