Post-spinel transition in Mg2SiO4 determined by high P - T in situ X-ray diffractometry

Tomoo Katsura, Hitoshi Yamada, Toru Shinmei, Atsushi Kubo, Shigeaki Ono, Masami Kanzaki, Akira Yoneda, Michael J. Walter, Eiji Ito, Satoru Urakawa, Kenichi Funakoshi, Wataru Utsumi

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