Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2

Y. Harada, T. Kinugasa, Ritsuko Eguchi, M. Matsubara, A. Kotani, M. Watanabe, A. Yagishita, S. Shin

Research output: Contribution to journalArticle

77 Citations (Scopus)

Abstract

Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d1L-1 and 3d0 states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type charge transfer excitations or interband transition from O 2p valence to Ti 3d conduction bands, which includes the crystal field splitting in D2h symmetry with two Ti-O bond lengths.

Original languageEnglish
Pages (from-to)12854-12859
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume61
Issue number19
Publication statusPublished - 2000
Externally publishedYes

Fingerprint

x ray scattering
Raman scattering
Polarization
Raman spectra
X rays
polarization
Charge transfer
charge transfer
Crystal symmetry
Bond length
Electron transitions
Conduction bands
excitation
crystal field theory
Absorption spectra
conduction bands
Photons
valence
absorption spectra
Crystals

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Harada, Y., Kinugasa, T., Eguchi, R., Matsubara, M., Kotani, A., Watanabe, M., ... Shin, S. (2000). Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2 Physical Review B - Condensed Matter and Materials Physics, 61(19), 12854-12859.

Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2 . / Harada, Y.; Kinugasa, T.; Eguchi, Ritsuko; Matsubara, M.; Kotani, A.; Watanabe, M.; Yagishita, A.; Shin, S.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 61, No. 19, 2000, p. 12854-12859.

Research output: Contribution to journalArticle

Harada, Y, Kinugasa, T, Eguchi, R, Matsubara, M, Kotani, A, Watanabe, M, Yagishita, A & Shin, S 2000, 'Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2 ', Physical Review B - Condensed Matter and Materials Physics, vol. 61, no. 19, pp. 12854-12859.
Harada, Y. ; Kinugasa, T. ; Eguchi, Ritsuko ; Matsubara, M. ; Kotani, A. ; Watanabe, M. ; Yagishita, A. ; Shin, S. / Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2 In: Physical Review B - Condensed Matter and Materials Physics. 2000 ; Vol. 61, No. 19. pp. 12854-12859.
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AU - Kinugasa, T.

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AU - Watanabe, M.

AU - Yagishita, A.

AU - Shin, S.

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AB - Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d1L-1 and 3d0 states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type charge transfer excitations or interband transition from O 2p valence to Ti 3d conduction bands, which includes the crystal field splitting in D2h symmetry with two Ti-O bond lengths.

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