Polarization dependence of resonant soft x-ray emission spectra in Ce compounds

M. Watanabe, Y. Harada, M. Nakazawa, Y. Ishiwata, Ritsuko Eguchi, T. Takeuchi, A. Kotani, S. Shin

Research output: Contribution to journalArticle

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Abstract

The electronic structures of Ce compounds have been investigated by means of resonant soft x-ray emission spectroscopy (RXES) excited at resonant energy range of Ce 3d → 4f absorption. Polarization dependence of the RXES shows information on concerning electronic states. In CEO2, the Ce 4f → 3d RXES spectra are interpreted as electronic structures hybridized between 4f0 and 4f1v states. Peaks appearing in the spectra are attributed to bonding, nonbonding, and antibonding states between those states, while the spectra of CeRh3 cannot be explained by only using the hybridization between 4f0 and 4f1v states. The spectra have large broad Raman peak, especially when the excitation photon energy is set at satellite of Ce 3d → 4f absorption. We attribute the origin of the broad Raman peak to hybridization states involving electron-hole pairs.

Original languageEnglish
Pages (from-to)983-987
Number of pages5
JournalSurface Review and Letters
Volume9
Issue number2
DOIs
Publication statusPublished - Apr 2002
Externally publishedYes

Fingerprint

x ray spectra
Emission spectroscopy
emission spectra
Polarization
X rays
Electronic structure
polarization
Electronic states
spectroscopy
electronic structure
Electron energy levels
x rays
Photons
Satellites
energy
photons
electronics
excitation

ASJC Scopus subject areas

  • Materials Science(all)
  • Surfaces and Interfaces
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Watanabe, M., Harada, Y., Nakazawa, M., Ishiwata, Y., Eguchi, R., Takeuchi, T., ... Shin, S. (2002). Polarization dependence of resonant soft x-ray emission spectra in Ce compounds. Surface Review and Letters, 9(2), 983-987. https://doi.org/10.1142/S0218625X02003184

Polarization dependence of resonant soft x-ray emission spectra in Ce compounds. / Watanabe, M.; Harada, Y.; Nakazawa, M.; Ishiwata, Y.; Eguchi, Ritsuko; Takeuchi, T.; Kotani, A.; Shin, S.

In: Surface Review and Letters, Vol. 9, No. 2, 04.2002, p. 983-987.

Research output: Contribution to journalArticle

Watanabe, M, Harada, Y, Nakazawa, M, Ishiwata, Y, Eguchi, R, Takeuchi, T, Kotani, A & Shin, S 2002, 'Polarization dependence of resonant soft x-ray emission spectra in Ce compounds', Surface Review and Letters, vol. 9, no. 2, pp. 983-987. https://doi.org/10.1142/S0218625X02003184
Watanabe, M. ; Harada, Y. ; Nakazawa, M. ; Ishiwata, Y. ; Eguchi, Ritsuko ; Takeuchi, T. ; Kotani, A. ; Shin, S. / Polarization dependence of resonant soft x-ray emission spectra in Ce compounds. In: Surface Review and Letters. 2002 ; Vol. 9, No. 2. pp. 983-987.
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