Polarization dependence of resonant soft x-ray emission spectra in Ce compounds

M. Watanabe, Y. Harada, M. Nakazawa, Y. Ishiwata, R. Eguchi, T. Takeuchi, A. Kotani, S. Shin

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8 Citations (Scopus)

Abstract

The electronic structures of Ce compounds have been investigated by means of resonant soft x-ray emission spectroscopy (RXES) excited at resonant energy range of Ce 3d → 4f absorption. Polarization dependence of the RXES shows information on concerning electronic states. In CEO2, the Ce 4f → 3d RXES spectra are interpreted as electronic structures hybridized between 4f0 and 4f1v states. Peaks appearing in the spectra are attributed to bonding, nonbonding, and antibonding states between those states, while the spectra of CeRh3 cannot be explained by only using the hybridization between 4f0 and 4f1v states. The spectra have large broad Raman peak, especially when the excitation photon energy is set at satellite of Ce 3d → 4f absorption. We attribute the origin of the broad Raman peak to hybridization states involving electron-hole pairs.

Original languageEnglish
Pages (from-to)983-987
Number of pages5
JournalSurface Review and Letters
Volume9
Issue number2
DOIs
Publication statusPublished - Apr 1 2002
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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    Watanabe, M., Harada, Y., Nakazawa, M., Ishiwata, Y., Eguchi, R., Takeuchi, T., Kotani, A., & Shin, S. (2002). Polarization dependence of resonant soft x-ray emission spectra in Ce compounds. Surface Review and Letters, 9(2), 983-987. https://doi.org/10.1142/S0218625X02003184