Planar defects in the new superconducting oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3Oz observed by high-resolution transmission electron microscopy

Yoshio Matsui, Shigeo Horiuchi, Hiroshi Sawa, Kazuhiko Obara, Jun Akimitsu

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14 Citations (Scopus)

Abstract

Planar defects in the 2-2-3 type of new superconducting oxide, R2B2Cu3Oz [R is (Eu1-xCex), B is (Ba1-yEuy); x and y are about 0.33 and z is about 8.54], recently discovered by Sawa et al. are examined by high-resolution transmission electron microscopy. The planar defects are derived by the local replacements of R2O2-layers by R-layers to form defect slabs of 1.2 nm thickness, having local structure similar to that of RBa2Cu3Oy.

Original languageEnglish
Pages (from-to)1555-1557
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume28
Issue number9
Publication statusPublished - Sep 1989
Externally publishedYes

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High resolution transmission electron microscopy
Defects
transmission electron microscopy
Oxides
oxides
high resolution
defects
slabs

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Planar defects in the new superconducting oxide (Eu1-xCex)2(Ba1-yEuy)2Cu3Oz observed by high-resolution transmission electron microscopy. / Matsui, Yoshio; Horiuchi, Shigeo; Sawa, Hiroshi; Obara, Kazuhiko; Akimitsu, Jun.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 28, No. 9, 09.1989, p. 1555-1557.

Research output: Contribution to journalArticle

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