Persistent insulator-to-metal transition of a VO2 thin film induced by soft X-ray irradiation

Yuji Muraoka, Hiroki Nagao, Shinsuke Katayama, Takanori Wakita, Masaaki Hirai, Takayoshi Yokoya, Hiroshi Kumigashira, Masaharu Oshima

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Abstract

We present a persistent soft-X-ray-induced insulator-to-metal transition at room temperature for VO2 thin films. Continuous soft X-ray irradiation renders the insulating electronic state metallic in the VO 2 thin films, which has been found by photoemission spectroscopy measurement. The observed transition is irreversible and the metallic state persists when soft X-ray irradiation is stopped. The analysis of valence band spectra reveals that the density of states (DOS) of the V 3d band increases with irradiation time, while the DOS of the O 2p band decreases. We propose a simple model where the persistent insulator-to-metal transition is driven by oxygen desorption from VO2 thin films under soft X-ray irradiation. The present results will help in developing a new route for controlling the phase transition of VO2 by light.

Original languageEnglish
Article number05FB09
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume53
Issue number5 SPEC. ISSUE 1
DOIs
Publication statusPublished - 2014

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ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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