Novel technique for trace element analysis using the ECRIS and heavy ion linear accelerator (ECRIS-AMS)

M. Kidera, T. Nakagawa, K. Takahashi, S. Enomoto, R. Hirunuma, K. Igarashi, M. Fujimaki, E. Ikezawa, O. Kamigaito, M. Kase, Y. Yano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We have developed the new analytical system which consists of electron cyclotron resonance ion source (ECRIS) and heavy ion linear accelerator. ECRIS-AMS (Accelerator Mass Spectrometry using Electron Cyclotron Resonance Ion Source) has several advantages described below. 1) The production of positive ions in the ECRIS is not influenced by ionization selectivity. 2) We can analyze many trace elements simultaneously in the material with very low background. 3) We can minimize the spectroscopic interference by using the high temperature ECR plasma. Using this system, we have measured elemental compositions in rock reference samples (JB-2). From our experimental results, it is considered that the further development and establishment of this method will play an important role in the trace element analysis. For this application, we just need small heavy ion linear accelerator which has acceleration energy of ∼ 1MeV/u. In this contribution, we will present the procedure of analysis in detail and several experimental results for trace element analysis in the materials.

Original languageEnglish
Title of host publicationElectron Cyclotron Resonance Ion Sources - 16th International Workshop on ECR Ion Sources, ECRIS'04
Pages85-87
Number of pages3
DOIs
Publication statusPublished - Dec 1 2005
Event16th International Workshop on ECR Ion Sources, ECRIS'04 - Berkeley, CA, United States
Duration: Sep 26 2004Sep 30 2004

Publication series

NameAIP Conference Proceedings
Volume749
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other16th International Workshop on ECR Ion Sources, ECRIS'04
CountryUnited States
CityBerkeley, CA
Period9/26/049/30/04

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Kidera, M., Nakagawa, T., Takahashi, K., Enomoto, S., Hirunuma, R., Igarashi, K., Fujimaki, M., Ikezawa, E., Kamigaito, O., Kase, M., & Yano, Y. (2005). Novel technique for trace element analysis using the ECRIS and heavy ion linear accelerator (ECRIS-AMS). In Electron Cyclotron Resonance Ion Sources - 16th International Workshop on ECR Ion Sources, ECRIS'04 (pp. 85-87). (AIP Conference Proceedings; Vol. 749). https://doi.org/10.1063/1.1893372