Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope

Naoya Tada, Makoto Uchida, Yuki Uenoyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

When a material is subjected to a small mechanical load, it shows a small elastic deformation of the order of nanometer. If there is a crack on the surface or underneath the surface, small elastic deformation shows non-uniformity around the crack. In this study, a non-destructive crack detection method by nanometric change in material's surface profile is proposed, and a tensile test of notched plate specimen was carried out. A non-uniform height change by mechanical load appeared near the notch. This fact suggests that the proposed method is available as an NDE method.

Original languageEnglish
Title of host publicationAmerican Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP
Pages251-257
Number of pages7
Volume5
DOIs
Publication statusPublished - 2012
EventASME 2012 Pressure Vessels and Piping Conference, PVP 2012 - Toronto, ON, Canada
Duration: Jul 15 2012Jul 19 2012

Other

OtherASME 2012 Pressure Vessels and Piping Conference, PVP 2012
CountryCanada
CityToronto, ON
Period7/15/127/19/12

Fingerprint

Crack detection
Microscopes
Elastic deformation
Cracks

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Tada, N., Uchida, M., & Uenoyama, Y. (2012). Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope. In American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP (Vol. 5, pp. 251-257) https://doi.org/10.1115/PVP2012-78425

Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope. / Tada, Naoya; Uchida, Makoto; Uenoyama, Yuki.

American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP. Vol. 5 2012. p. 251-257.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tada, N, Uchida, M & Uenoyama, Y 2012, Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope. in American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP. vol. 5, pp. 251-257, ASME 2012 Pressure Vessels and Piping Conference, PVP 2012, Toronto, ON, Canada, 7/15/12. https://doi.org/10.1115/PVP2012-78425
Tada N, Uchida M, Uenoyama Y. Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope. In American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP. Vol. 5. 2012. p. 251-257 https://doi.org/10.1115/PVP2012-78425
Tada, Naoya ; Uchida, Makoto ; Uenoyama, Yuki. / Non-destructive crack detection by nanometric change in surface profile using digital holographic microscope. American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP. Vol. 5 2012. pp. 251-257
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