Non-contact thickness gauge for conductive aterials using HTS SQUID system

Toshihiko Kiwa, Hideaki Tahara, Etsuro Miyake, Hironobu Yamada, Keiji Tsukada

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Eddy current testing using high-Tc superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 × 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses Ga(f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The Ga(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.

Original languageEnglish
Article number5067094
Pages (from-to)801-803
Number of pages3
JournalIEEE Transactions on Applied Superconductivity
Volume19
Issue number3
DOIs
Publication statusPublished - Jun 1 2009

Keywords

  • Eddy current testing
  • Fourier transforms
  • High-temperature superconductors
  • Nondestructive testing
  • SQUIDs

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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