Abstract
Eddy current testing using high-Tc superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 × 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses Ga(f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The Ga(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.
Original language | English |
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Article number | 5067094 |
Pages (from-to) | 801-803 |
Number of pages | 3 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 19 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jun 2009 |
Keywords
- Eddy current testing
- Fourier transforms
- High-temperature superconductors
- Nondestructive testing
- SQUIDs
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering