Non-contact thickness gauge for conductive aterials using HTS SQUID system

Toshihiko Kiwa; Hideaki Tahara; Etsuro Miyake; Hironobu Yamada; Keiji Tsukada

doi:10.1109/TASC.2009.2019196

Non-contact thickness gauge for conductive aterials using HTS SQUID system

Toshihiko Kiwa, Hideaki Tahara, Etsuro Miyake, Hironobu Yamada, Keiji Tsukada

Research output: Contribution to journal › Article

9 Citations (Scopus)

Abstract

Eddy current testing using high-T_c superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 × 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses Ga(f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The Ga(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.

Original language	English
Article number	5067094
Pages (from-to)	801-803
Number of pages	3
Journal	IEEE Transactions on Applied Superconductivity
Volume	19
Issue number	3
DOIs	https://doi.org/10.1109/TASC.2009.2019196
Publication status	Published - Jun 1 2009

Keywords

Eddy current testing
Fourier transforms
High-temperature superconductors
Nondestructive testing
SQUIDs

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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Kiwa, T., Tahara, H., Miyake, E., Yamada, H., & Tsukada, K. (2009). Non-contact thickness gauge for conductive aterials using HTS SQUID system. IEEE Transactions on Applied Superconductivity, 19(3), 801-803. [5067094]. https://doi.org/10.1109/TASC.2009.2019196

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abstract = "Eddy current testing using high-Tc superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 × 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses Ga(f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The Ga(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.",

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AU - Kiwa, Toshihiko

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AU - Yamada, Hironobu

AU - Tsukada, Keiji

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N2 - Eddy current testing using high-Tc superconductive (HTS) superconducting quantum interference devices (SQUID), was developed to realize non-contact thickness gauge measurement of conductive materials, due to their high-sensitivity to magnetic fields generated by eddy currents. A HTS SQUID pulsed eddy current system with Fourier transform analysis is proposed and demonstrated. Aluminum plates (10 × 10 mm) with thicknesses in the range of 1 to 10 mm were used as test samples. The intrinsic responses Ga(f) of the samples were successfully extracted. The slopes of these responses were estimated by linear fitting, and plotted as a function of sample thickness. The Ga(f) slopes decrease with increasing thickness of the test samples. The analysed data suggests that this system can be used as a non-contact thickness gauge for conductive materials.

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