Noise characteristics of stacked CMOS active pixel sensor for charged particles

Physics & Astronomy

• CMOS 62%
• charged particles 59%
• pixels 56%
• sensors 42%
• ions 27%
• shot noise 22%
• leakage 16%
• microanalysis 10%
• ion irradiation 10%
• dark current 10%
• secondary ion mass spectrometry 10%
• dynamic range 9%
• readout 9%
• capacitors 8%
• sensitivity 5%
• detectors 5%

Engineering & Materials Science

• Charged particles 100%
• Pixels 52%
• Sensors 35%
• Shot noise 34%
• Ion bombardment 18%
• Dark currents 17%
• Secondary ion mass spectrometry 17%
• Microanalysis 16%
• Leakage currents 12%
• Electrons 11%
• Capacitors 9%
• Detectors 9%
• Hot Temperature 5%