NIST Statistical Test for Random Sequence Generated by Möbius Function

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Random sequences play important roles in many security applications. Several security protocols have been developed based on random sequences. Hence, their generation is one of the topic of interests among many cryptographic researchers. Previously, the authors proposed a pseudo random sequence over odd characteristic field which is generated by applying primitive polynomial, trace function and Mobius function. Some important properties such as period, autocorrelation and cross-correlation have been presented in previous work. Randomness is generally measured by statistical tests and NIST Statistical Test Suite (NIST STS) is one of the most popular tools for randomness analysis. In this work, the randomness of the generated sequence is investigated by NIST STS.

Original languageEnglish
Title of host publication2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728132792
DOIs
Publication statusPublished - May 2019
Event6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019 - Yilan, Taiwan, Province of China
Duration: May 20 2019May 22 2019

Publication series

Name2019 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019

Conference

Conference6th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2019
CountryTaiwan, Province of China
CityYilan
Period5/20/195/22/19

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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