Nano-sized domains related to dielectric anomaly in YFe2O 4-δ

Y. Horibe, K. Kishimoto, S. Mori, N. Ikeda

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Abstract

We examined microstructures related to the charge ordering in YFe 2O4-δ, by transmission electron microscopy. It is found that two types of characteristic diffuse scatterings appear at room temperature. One is characteristic diffuse streaks elongated along the [0001] direction through the (1/3 1/3 2/3 0)-type reciprocal positions and the other is diffuse spots at (1/3 - η 1/3 - η 2/3 + 2 η 0)-type incommensurate positions (η ≈ 0.066). Real-space images revealed that the former diffuse scattering is related to nano-domains due to the charge ordering and the latter one is related to those due to vacancy ordering. The presence of the nano-sized domains should be strongly related to the dielectric anomalies found in YFe2O4-δ.

Original languageEnglish
Pages (from-to)i87-i90
JournalJournal of Electron Microscopy
Volume54
Issue numberSUPPL. 1
DOIs
Publication statusPublished - Sep 1 2005
Externally publishedYes

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Keywords

  • Charge ordering
  • Nano-sized domains
  • RFeO
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Instrumentation

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