Multi-wavelength study of PPDs using an OPO tunable pulse laser microscope system

Koji Yoshimura, Isamu Nakamura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.

Original languageEnglish
Pages (from-to)197-201
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume695
DOIs
Publication statusPublished - Dec 11 2012
Externally publishedYes

Fingerprint

Optical parametric oscillators
parametric amplifiers
Laser pulses
Microscopes
Photons
microscopes
Detectors
Wavelength
Lasers
detectors
photons
pulses
wavelengths
lasers
Pixels
pixels
Pulsed lasers
pulsed lasers
penetration
Silicon

Keywords

  • Multi-wavelength
  • OPO tunable laser
  • PPD

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

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abstract = "We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.",
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AU - Nakamura, Isamu

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N2 - We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.

AB - We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.

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