Abstract
We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼2μm diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.
Original language | English |
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Pages (from-to) | 197-201 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 695 |
DOIs | |
Publication status | Published - Dec 11 2012 |
Externally published | Yes |
Keywords
- Multi-wavelength
- OPO tunable laser
- PPD
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation