Multi-value sequence generated by trace function and power residue symbol over proper sub extension field

Ali Md Arshad, Takeru Miyazaki, Yasuyuki Nogami, Satoshi Uehara, Robert Morelos-Zaragoza

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The authors in this paper have proposed a multi-value sequence generated by a primitive polynomial, trace function, k-th power residue symbol, and a certain mapping function over the proper sub extension field. Here, the trace function actually maps an element of the extension field to an element of the proper sub extension field, which is actually a vector space. The distribution of numbers within the sequence becomes more balanced by considering the proper sub extension field. In addition, its period and autocorrelation properties also observed in this paper.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages249-250
Number of pages2
ISBN (Electronic)9781509040179
DOIs
Publication statusPublished - Jul 25 2017
Externally publishedYes
Event4th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017 - Taipei, United States
Duration: Jun 12 2017Jun 14 2017

Other

Other4th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017
CountryUnited States
CityTaipei
Period6/12/176/14/17

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ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications
  • Signal Processing
  • Biomedical Engineering
  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

Arshad, A. M., Miyazaki, T., Nogami, Y., Uehara, S., & Morelos-Zaragoza, R. (2017). Multi-value sequence generated by trace function and power residue symbol over proper sub extension field. In 2017 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017 (pp. 249-250). [7991089] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-China.2017.7991089