Multi-ion sensing in solutions by a terahertz chemical microscopy

K. Akimune, Y. Okawa, T. Hagiwara, Kenji Sakai, Toshihiko Kiwa, Keiji Tsukada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A terahertz chemical microscopy (TCM) has been proposed and developed in order to visualize the chemical potential changes in the water solution. In this paper, ion sensing in solutions, as an application of terahertz chemical microscopy, are introduced, and we observed the variation of amplitude of THz wave. In TCM, we detect the change in the amplitude of radiated THz wave from a THz sensing plate. The sensing plate is that the amplitude of radiated THz wave changes when chemical reactions are undergo on the THz sensing plate. We immobilized ion sensitive membranes, which can take the certain ion, on the surface of SiO2side of THz sensing plate. We dropped the sodium solution of 10-4M and 10-1M. The amplitude of radiated THz wave as the concentration of 10-1M was large in magnitude than the concentration of 10-4M where the ion sensitive membrane was immobilized. We can also visualize the concentration of ions to get image. From these results, we can detect ions in solution using TCM.

Original languageEnglish
Title of host publication2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467352253
DOIs
Publication statusPublished - Oct 17 2014
Event31st General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2014 - Beijing, China
Duration: Aug 16 2014Aug 23 2014

Other

Other31st General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2014
CountryChina
CityBeijing
Period8/16/148/23/14

Fingerprint

Microscopic examination
Ions
Membranes
Chemical potential
Chemical reactions
Sodium
Water

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Networks and Communications

Cite this

Akimune, K., Okawa, Y., Hagiwara, T., Sakai, K., Kiwa, T., & Tsukada, K. (2014). Multi-ion sensing in solutions by a terahertz chemical microscopy. In 2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014 [6930079] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/URSIGASS.2014.6930079

Multi-ion sensing in solutions by a terahertz chemical microscopy. / Akimune, K.; Okawa, Y.; Hagiwara, T.; Sakai, Kenji; Kiwa, Toshihiko; Tsukada, Keiji.

2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 6930079.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Akimune, K, Okawa, Y, Hagiwara, T, Sakai, K, Kiwa, T & Tsukada, K 2014, Multi-ion sensing in solutions by a terahertz chemical microscopy. in 2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014., 6930079, Institute of Electrical and Electronics Engineers Inc., 31st General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2014, Beijing, China, 8/16/14. https://doi.org/10.1109/URSIGASS.2014.6930079
Akimune K, Okawa Y, Hagiwara T, Sakai K, Kiwa T, Tsukada K. Multi-ion sensing in solutions by a terahertz chemical microscopy. In 2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014. Institute of Electrical and Electronics Engineers Inc. 2014. 6930079 https://doi.org/10.1109/URSIGASS.2014.6930079
Akimune, K. ; Okawa, Y. ; Hagiwara, T. ; Sakai, Kenji ; Kiwa, Toshihiko ; Tsukada, Keiji. / Multi-ion sensing in solutions by a terahertz chemical microscopy. 2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014. Institute of Electrical and Electronics Engineers Inc., 2014.
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