Momentum-resolved charge excitations in high-Tc cuprates studied by resonant inelastic X-ray scattering

K. Ishii, M. Hoesch, T. Inami, K. Kuzushita, K. Ohwada, M. Tsubota, Y. Murakami, J. Mizuki, Y. Endoh, K. Tsutsui, T. Tohyama, S. Maekawa, K. Yamada, T. Masui, S. Tajima, H. Kawashima, J. Akimitsu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


We report a Cu K-edge resonant inelastic X-ray scattering (RIXS) study of high-Tc cuprates. Momentum-resolved charge excitations in the CuO2 plane are examined from parent Mott insulators to carrier-doped superconductors. The Mott gap excitation in undoped insulators is found to commonly show a larger dispersion along the [π, π] direction than the [π, 0] direction. On the other hand, the resonance condition displays material dependence. The Mott gap persists in carrier-doped states. Upon hole doping, the dispersion of the Mott gap excitation becomes weaker associated with the reduction of antiferromagnetic correlation and an intraband excitation appears as a continuum intensity below the gap at the same time. In the case of electron doping, the Mott gap excitation is prominent at the zone center and a dispersive intraband excitation is observed at finite momentum transfer.

Original languageEnglish
Pages (from-to)3118-3124
Number of pages7
JournalJournal of Physics and Chemistry of Solids
Issue number12
Publication statusPublished - Dec 2008
Externally publishedYes


  • A. Oxides
  • A. Superconductors
  • D. Electronic structure

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics


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