Model-based SAR ATR system

Katsushi Ikeuchi, Mark D. Wheeler, Taku Yamazaki, Takeshi Shakunaga

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

Recognizing a target in SAR images is an important, yet challenging application of model-based vision. This paper describes a model-based SAR recognition system based on invariant histograms and deformable template matching techniques. An invariant histogram is a histogram of invariant values defined by geometric features such as points and lines in SAR images. Although a few invariances are sufficient to recognize a target, we histogram all invariant values given by all possible target feature pairs. This redundant representation enables robust recognition under severe occlusions typical of SAR recognition scenarios. Multi-step deformable template matching examines the existence of an object by superimposing templates over potential energy field generated from images or primitive features. It determines the template configuration which has the minimum deformation and the best alignment of the template with features. The deformability of the template absorbs the instability of SAR features. We have implemented the system and evaluated the system performance using hybrid SAR images, generated from synthetic model signatures and real SAR background signatures.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsEdmund G. Zelnio, Robert J. Douglass
Pages376-387
Number of pages12
Volume2757
Publication statusPublished - 1996
Externally publishedYes
EventAlgorithms for Synthetic Aperture Radar Imagery III - Orlando, FL, USA
Duration: Apr 10 1996Apr 12 1996

Other

OtherAlgorithms for Synthetic Aperture Radar Imagery III
CityOrlando, FL, USA
Period4/10/964/12/96

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ikeuchi, K., Wheeler, M. D., Yamazaki, T., & Shakunaga, T. (1996). Model-based SAR ATR system. In E. G. Zelnio, & R. J. Douglass (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2757, pp. 376-387)