Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto

Research output: Contribution to journalConference article

Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

Original languageEnglish
Pages (from-to)280-285
Number of pages6
JournalProceedings of the Asian Test Symposium
Publication statusPublished - Dec 1 1994
EventProceedings of the 3rd Asian Test Symposium - Nara, Jpn
Duration: Nov 15 1994Nov 17 1994

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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