Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
Editors Anon
PublisherIEEE
Pages280-285
Number of pages6
Publication statusPublished - 1994
EventProceedings of the 3rd Asian Test Symposium - Nara, Jpn
Duration: Nov 15 1994Nov 17 1994

Other

OtherProceedings of the 3rd Asian Test Symposium
CityNara, Jpn
Period11/15/9411/17/94

Fingerprint

Combinatorial circuits
Networks (circuits)
Testing

ASJC Scopus subject areas

  • Hardware and Architecture
  • Media Technology

Cite this

Yokohira, T., Shimizu, T., Michinishi, H., Sugiyama, Y., & Okamoto, T. (1994). Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. In Anon (Ed.), Proceedings of the Asian Test Symposium (pp. 280-285). IEEE.

Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. / Yokohira, Tokumi; Shimizu, Toshimi; Michinishi, Hiroyuki; Sugiyama, Yuji; Okamoto, Takuji.

Proceedings of the Asian Test Symposium. ed. / Anon. IEEE, 1994. p. 280-285.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yokohira, T, Shimizu, T, Michinishi, H, Sugiyama, Y & Okamoto, T 1994, Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. in Anon (ed.), Proceedings of the Asian Test Symposium. IEEE, pp. 280-285, Proceedings of the 3rd Asian Test Symposium, Nara, Jpn, 11/15/94.
Yokohira T, Shimizu T, Michinishi H, Sugiyama Y, Okamoto T. Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. In Anon, editor, Proceedings of the Asian Test Symposium. IEEE. 1994. p. 280-285
Yokohira, Tokumi ; Shimizu, Toshimi ; Michinishi, Hiroyuki ; Sugiyama, Yuji ; Okamoto, Takuji. / Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. Proceedings of the Asian Test Symposium. editor / Anon. IEEE, 1994. pp. 280-285
@inproceedings{73d3c0a365cd4e0cb2c4ef0723d51a30,
title = "Minimum test sets for locally exhaustive testing of combinational circuits with five outputs",
abstract = "In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.",
author = "Tokumi Yokohira and Toshimi Shimizu and Hiroyuki Michinishi and Yuji Sugiyama and Takuji Okamoto",
year = "1994",
language = "English",
pages = "280--285",
editor = "Anon",
booktitle = "Proceedings of the Asian Test Symposium",
publisher = "IEEE",

}

TY - GEN

T1 - Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

AU - Yokohira, Tokumi

AU - Shimizu, Toshimi

AU - Michinishi, Hiroyuki

AU - Sugiyama, Yuji

AU - Okamoto, Takuji

PY - 1994

Y1 - 1994

N2 - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

AB - In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

UR - http://www.scopus.com/inward/record.url?scp=0028727436&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028727436&partnerID=8YFLogxK

M3 - Conference contribution

SP - 280

EP - 285

BT - Proceedings of the Asian Test Symposium

A2 - Anon, null

PB - IEEE

ER -