Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Tokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2w test patterns, where w is the maximum number of inputs on which any output depends.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
Editors Anon
PublisherIEEE
Pages280-285
Number of pages6
Publication statusPublished - 1994
EventProceedings of the 3rd Asian Test Symposium - Nara, Jpn
Duration: Nov 15 1994Nov 17 1994

Other

OtherProceedings of the 3rd Asian Test Symposium
CityNara, Jpn
Period11/15/9411/17/94

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ASJC Scopus subject areas

  • Hardware and Architecture
  • Media Technology

Cite this

Yokohira, T., Shimizu, T., Michinishi, H., Sugiyama, Y., & Okamoto, T. (1994). Minimum test sets for locally exhaustive testing of combinational circuits with five outputs. In Anon (Ed.), Proceedings of the Asian Test Symposium (pp. 280-285). IEEE.