Microstructural properties of (112¯0)-oriented hematite-ilmenite solid solution films

Tatsuo Fujii, Tomohiro Mino, Shunsuke Kanamaru, Makoto Nakanishi, Hideki Hashimoto, Jun Takada

Research output: Contribution to journalArticle

Abstract

Ilmenite-hematite solid solution (Fe2-xTixO3) is one of the candidates for high-temperature magnetic semiconductors. Well-crystallized and epitaxially formed Fe2-xTixO3 films on α-Al2O3 (112¯0) single-crystalline substrates were tried to fabricate by using reactive sputtering technique. The detailed structural properties of (112¯0)-oriented epitaxial Fe1.4Ti0.6O3 films were analyzed by using transmission electron microscope (TEM). The films showed large magnetization and typical semiconductive conduction at room temperature. However their anisotropic properties were rather small than expected, though the films had good crystallinity with preferred orientation. The TEM observations clearly revealed that the (112¯0)-oriented Fe1.4Ti0.6O3 films on α-Al2O3(112¯0) were partly composed of the (0001)-oriented grains. Formation of the (0001)-oriented grains could reduce the anisotropic properties of the (112¯0)-oriented films.

Original languageEnglish
Pages (from-to)245-249
Number of pages5
JournalThin Solid Films
Volume591
DOIs
Publication statusPublished - Sep 30 2015

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Keywords

  • Epitaxial film
  • High-resolution scanning transmission electron microscopy
  • Ilmenite-hematite solid solution
  • Magnetic and electric anisotropies

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

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