Microscopic conduction behavior analysis on ZrO2-based ion conductors by wideband conductivity measurement

Takashi Teranishi, Kosuke Shimizu, Hidetaka Hayashi, Akira Kishimoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

All contributions to the total conductivity, electrolyte-electrode interfaces, grain boundaries, ion-hopping, and optical phonons, were determined on the 8 mol% yttria-stabilized zirconia (8YSZ) and 8 mol% ytterbia-stabilized zirconia (8YbSZ) ceramics using the wideband conductivity spectroscopy. Complex conductivity spectra from 10-1 Hz to 1014 Hz were successfully obtained. The higher total conductivity of the 8YbSZ ceramics compared to the 8YSZ in wideband frequencies was mainly attributed to difference in the DC conductivity due to universal dielectric response (UDR), σdc; σdc (8YbSZ) > σdc (8YSZ). Other parameters in the UDR and the optical phonon parameters did not greatly influence on the difference in their intrinsic conductivities.

Original languageEnglish
Title of host publicationElectroceramics in Japan XV
PublisherTrans Tech Publications Ltd
Pages141-144
Number of pages4
ISBN (Print)9783037857618
DOIs
Publication statusPublished - Jan 1 2013
Event31st Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan
Duration: Oct 28 2011Oct 29 2011

Publication series

NameKey Engineering Materials
Volume566
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Other

Other31st Electronics Division Meeting of the Ceramic Society of Japan
CountryJapan
CityTokyo
Period10/28/1110/29/11

Keywords

  • Conductivity spectroscopy
  • Optical phonon modes
  • Universal dielectric response

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Teranishi, T., Shimizu, K., Hayashi, H., & Kishimoto, A. (2013). Microscopic conduction behavior analysis on ZrO2-based ion conductors by wideband conductivity measurement. In Electroceramics in Japan XV (pp. 141-144). (Key Engineering Materials; Vol. 566). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.566.141