Microscopic conduction behavior analysis on ZrO2-based ion conductors by wideband conductivity measurement

Takashi Teranishi; Kosuke Shimizu; Hidetaka Hayashi; Akira Kishimoto

doi:10.4028/www.scientific.net/KEM.566.141

Microscopic conduction behavior analysis on ZrO₂-based ion conductors by wideband conductivity measurement

Takashi Teranishi, Kosuke Shimizu, Hidetaka Hayashi, Akira Kishimoto

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

All contributions to the total conductivity, electrolyte-electrode interfaces, grain boundaries, ion-hopping, and optical phonons, were determined on the 8 mol% yttria-stabilized zirconia (8YSZ) and 8 mol% ytterbia-stabilized zirconia (8YbSZ) ceramics using the wideband conductivity spectroscopy. Complex conductivity spectra from 10^-1 Hz to 10¹⁴ Hz were successfully obtained. The higher total conductivity of the 8YbSZ ceramics compared to the 8YSZ in wideband frequencies was mainly attributed to difference in the DC conductivity due to universal dielectric response (UDR), σ_dc; σ_dc _(8YbSZ) > σ_dc _(8YSZ). Other parameters in the UDR and the optical phonon parameters did not greatly influence on the difference in their intrinsic conductivities.

Original language	English
Title of host publication	Electroceramics in Japan XV
Pages	141-144
Number of pages	4
DOIs	https://doi.org/10.4028/www.scientific.net/KEM.566.141
Publication status	Published - Sep 11 2013
Event	31st Electronics Division Meeting of the Ceramic Society of Japan - Tokyo, Japan Duration: Oct 28 2011 → Oct 29 2011

Publication series

Name	Key Engineering Materials
Volume	566
ISSN (Print)	1013-9826

Other

Other	31st Electronics Division Meeting of the Ceramic Society of Japan
Country	Japan
City	Tokyo
Period	10/28/11 → 10/29/11

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Keywords

Conductivity spectroscopy
Optical phonon modes
Universal dielectric response
ZrO-based

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Cite this

Teranishi, T., Shimizu, K., Hayashi, H., & Kishimoto, A. (2013). Microscopic conduction behavior analysis on ZrO₂-based ion conductors by wideband conductivity measurement. In Electroceramics in Japan XV (pp. 141-144). (Key Engineering Materials; Vol. 566). https://doi.org/10.4028/www.scientific.net/KEM.566.141

Teranishi, T, Shimizu, K, Hayashi, H & Kishimoto, A 2013, Microscopic conduction behavior analysis on ZrO₂-based ion conductors by wideband conductivity measurement. in Electroceramics in Japan XV. Key Engineering Materials, vol. 566, pp. 141-144, 31st Electronics Division Meeting of the Ceramic Society of Japan, Tokyo, Japan, 10/28/11. https://doi.org/10.4028/www.scientific.net/KEM.566.141

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Access to Document

10.4028/www.scientific.net/KEM.566.141