TY - GEN
T1 - MEMS dynamic optically reconfigurable gate array usable under a space radiation environment
AU - Seto, Daisaku
AU - Watanabe, Minoru
PY - 2010
Y1 - 2010
N2 - Embedded devices used for spacecraft, satellites, and space stations are vulnerable to the effects of high-energy charged particles. To resolve single-event latch-up (SEL)-associated troubles more flexibly using limited hardware resources in a space environment, reconfigurable devices such as field programmable gate arrays (FPGAs) are suitable. However, such reconfigurable systems present the shortcoming that the circuit itself on the gate array is not robust. The configuration context on a configuration SRAM also suffers from single-event upsets (SEUs) and SELs. This paper therefore proposes an MEMS dynamic optically reconfigurable gate array that is usable under a space radiation environment. The technique enables rapid recovery of a programmable device that has been damaged by high-energy charged particles. It uses incorrect configuration data including some error bits that had been damaged by particles. The configuration data are transferred using wireless communications and are retained on an EEPROM/SRAM.
AB - Embedded devices used for spacecraft, satellites, and space stations are vulnerable to the effects of high-energy charged particles. To resolve single-event latch-up (SEL)-associated troubles more flexibly using limited hardware resources in a space environment, reconfigurable devices such as field programmable gate arrays (FPGAs) are suitable. However, such reconfigurable systems present the shortcoming that the circuit itself on the gate array is not robust. The configuration context on a configuration SRAM also suffers from single-event upsets (SEUs) and SELs. This paper therefore proposes an MEMS dynamic optically reconfigurable gate array that is usable under a space radiation environment. The technique enables rapid recovery of a programmable device that has been damaged by high-energy charged particles. It uses incorrect configuration data including some error bits that had been damaged by particles. The configuration data are transferred using wireless communications and are retained on an EEPROM/SRAM.
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U2 - 10.1007/978-3-642-12133-3_14
DO - 10.1007/978-3-642-12133-3_14
M3 - Conference contribution
AN - SCOPUS:77951279660
SN - 3642121322
SN - 9783642121326
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 134
EP - 144
BT - Reconfigurable Computing
T2 - 6th International Symposium on Applied Reconfigurable Computing, ARC 2010
Y2 - 17 March 2010 through 19 March 2010
ER -