MEASURING DEVICE AND MEASURING METHOD THAT USE PULSED ELECTROMAGNETIC WAVE

TOSHIHIKO KIWA (Inventor), KEIJI TSUKADA (Inventor)

Research output: Patent

Abstract

Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Said measuring device is provided with a first beam splitter which divides the pulsed laser beam into two, a detection region part into which the solution containing the substance to be detected can be introduced, and a reference region part into which a reference solution can be introduced, irradiates a semiconductor corresponding to the detection region part and a semiconductor corresponding to the reference region respectively with the two divided pulsed laser beams, collects pulsed electromagnetic waves generated from the semiconductors corresponding to the detection region part and the reference region part, and detects the collected pulsed electromagnetic waves by said one detection means.

Original languageEnglish
Patent numberWO2011096563
IPCG01N 21/ 35 A I
Priority date2/8/10
Publication statusPublished - Aug 11 2011

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electromagnetic radiation
pulsed lasers
laser beams
beam splitters
irradiation
sensitivity

Cite this

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title = "MEASURING DEVICE AND MEASURING METHOD THAT USE PULSED ELECTROMAGNETIC WAVE",
abstract = "Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Said measuring device is provided with a first beam splitter which divides the pulsed laser beam into two, a detection region part into which the solution containing the substance to be detected can be introduced, and a reference region part into which a reference solution can be introduced, irradiates a semiconductor corresponding to the detection region part and a semiconductor corresponding to the reference region respectively with the two divided pulsed laser beams, collects pulsed electromagnetic waves generated from the semiconductors corresponding to the detection region part and the reference region part, and detects the collected pulsed electromagnetic waves by said one detection means.",
author = "TOSHIHIKO KIWA and KEIJI TSUKADA",
year = "2011",
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day = "11",
language = "English",
type = "Patent",
note = "WO2011096563; G01N 21/ 35 A I",

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AU - TSUKADA, KEIJI

PY - 2011/8/11

Y1 - 2011/8/11

N2 - Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Said measuring device is provided with a first beam splitter which divides the pulsed laser beam into two, a detection region part into which the solution containing the substance to be detected can be introduced, and a reference region part into which a reference solution can be introduced, irradiates a semiconductor corresponding to the detection region part and a semiconductor corresponding to the reference region respectively with the two divided pulsed laser beams, collects pulsed electromagnetic waves generated from the semiconductors corresponding to the detection region part and the reference region part, and detects the collected pulsed electromagnetic waves by said one detection means.

AB - Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity. Said measuring device is provided with a first beam splitter which divides the pulsed laser beam into two, a detection region part into which the solution containing the substance to be detected can be introduced, and a reference region part into which a reference solution can be introduced, irradiates a semiconductor corresponding to the detection region part and a semiconductor corresponding to the reference region respectively with the two divided pulsed laser beams, collects pulsed electromagnetic waves generated from the semiconductors corresponding to the detection region part and the reference region part, and detects the collected pulsed electromagnetic waves by said one detection means.

M3 - Patent

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