MAGNETIC IMPEDANCE MEASURING DEVICE

KEIJI TSUKADA, (Inventor), TOSHIHIKO KIWA, (Inventor)

Research output: Patent

Abstract

An AC magnetic field of low frequency is applied to a measurement object and distribution of induced current is measured to detect distribution of the impedance characteristic of the measurement object. A magnetic impedance measuring device includes: an application coil for generating an AC magnetic field whose frequency can be varied and a power source for the application coil; at least a pair of magnetic sensor means formed by two magnetic sensors for detecting a vector component parallel to the application coil surface by a vector component orthogonal to the magnetic field generated by the measurement object; magnetic sensor measuring means arranged apart from the application coil surface to oppose to the measurement object for measuring a detection signal of the magnetic sensor means; a lock-in amplifier circuit for detecting a signal of the same frequency as the application coil from the output of the magnetic sensor measuring means; and analysis means for analyzing the output intensity and the phase change of the magnetic sensor by the output signal of the lock-in amplifier circuit.

Original languageEnglish
Patent numberWO2006109382
IPCG01R 33/ 02 A I
Priority date3/14/05
Publication statusPublished - Oct 19 2006

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  • Cite this

    TSUKADA, KEIJI., & KIWA, TOSHIHIKO. (2006). IPC No. G01R 33/ 02 A I. MAGNETIC IMPEDANCE MEASURING DEVICE. (Patent No. WO2006109382).