Magnetic Flux Leakage Testing for Defect Characterization

Weiying Cheng; Yoshinori Kamiyama; Keiji Tsukada

doi:10.3233/978-1-61499-639-2-126

Magnetic Flux Leakage Testing for Defect Characterization

Weiying Cheng, Yoshinori Kamiyama, Keiji Tsukada

Research output: Chapter in Book/Report/Conference proceeding › Chapter

1 Citation (Scopus)

Abstract

As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.

Original language	English
Title of host publication	Electromagnetic Nondestructive Evaluation (XIX)
Editors	Tetsuya Uchimoto, Hiroaki Kikuchi, Noritaka Yusa
Publisher	IOS Press
Pages	126-133
Number of pages	8
ISBN (Electronic)	9781614996385
DOIs	https://doi.org/10.3233/978-1-61499-639-2-126
Publication status	Published - 2016

Publication series

Name	Studies in Applied Electromagnetics and Mechanics
Volume	41
ISSN (Print)	1383-7281
ISSN (Electronic)	1879-8322

Keywords

Magnetic flux leakage testing
Magneto-Impedance sensor
back-side wall thinning
local thinning
magnetic characterization

ASJC Scopus subject areas

Mechanical Engineering
Electrical and Electronic Engineering

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10.3233/978-1-61499-639-2-126

Cite this

Magnetic Flux Leakage Testing for Defect Characterization. / Cheng, Weiying; Kamiyama, Yoshinori; Tsukada, Keiji.

Electromagnetic Nondestructive Evaluation (XIX). ed. / Tetsuya Uchimoto; Hiroaki Kikuchi; Noritaka Yusa. IOS Press, 2016. p. 126-133 (Studies in Applied Electromagnetics and Mechanics; Vol. 41).

Research output: Chapter in Book/Report/Conference proceeding › Chapter

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Magnetic Flux Leakage Testing for Defect Characterization

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Keywords

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