Magnetic Flux Leakage Testing for Defect Characterization

Weiying Cheng, Yoshinori Kamiyama, Keiji Tsukada

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.

Original languageEnglish
Title of host publicationElectromagnetic Nondestructive Evaluation (XIX)
PublisherIOS Press
Pages126-133
Number of pages8
Volume41
ISBN (Electronic)9781614996385
DOIs
Publication statusPublished - 2016

Publication series

NameStudies in Applied Electromagnetics and Mechanics
Volume41
ISSN (Print)13837281
ISSN (Electronic)18798322

Fingerprint

Magnetic flux
Defects
Testing
Magnetic properties
Sensors
Computer simulation

Keywords

  • back-side wall thinning
  • local thinning
  • magnetic characterization
  • Magnetic flux leakage testing
  • Magneto-Impedance sensor

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Mechanical Engineering

Cite this

Cheng, W., Kamiyama, Y., & Tsukada, K. (2016). Magnetic Flux Leakage Testing for Defect Characterization. In Electromagnetic Nondestructive Evaluation (XIX) (Vol. 41, pp. 126-133). (Studies in Applied Electromagnetics and Mechanics; Vol. 41). IOS Press. https://doi.org/10.3233/978-1-61499-639-2-126

Magnetic Flux Leakage Testing for Defect Characterization. / Cheng, Weiying; Kamiyama, Yoshinori; Tsukada, Keiji.

Electromagnetic Nondestructive Evaluation (XIX). Vol. 41 IOS Press, 2016. p. 126-133 (Studies in Applied Electromagnetics and Mechanics; Vol. 41).

Research output: Chapter in Book/Report/Conference proceedingChapter

Cheng, W, Kamiyama, Y & Tsukada, K 2016, Magnetic Flux Leakage Testing for Defect Characterization. in Electromagnetic Nondestructive Evaluation (XIX). vol. 41, Studies in Applied Electromagnetics and Mechanics, vol. 41, IOS Press, pp. 126-133. https://doi.org/10.3233/978-1-61499-639-2-126
Cheng W, Kamiyama Y, Tsukada K. Magnetic Flux Leakage Testing for Defect Characterization. In Electromagnetic Nondestructive Evaluation (XIX). Vol. 41. IOS Press. 2016. p. 126-133. (Studies in Applied Electromagnetics and Mechanics). https://doi.org/10.3233/978-1-61499-639-2-126
Cheng, Weiying ; Kamiyama, Yoshinori ; Tsukada, Keiji. / Magnetic Flux Leakage Testing for Defect Characterization. Electromagnetic Nondestructive Evaluation (XIX). Vol. 41 IOS Press, 2016. pp. 126-133 (Studies in Applied Electromagnetics and Mechanics).
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