Magnetic Flux Leakage Testing for Defect Characterization

Weiying Cheng; Yoshinori Kamiyama; Keiji Tsukada

doi:10.3233/978-1-61499-639-2-126

Magnetic Flux Leakage Testing for Defect Characterization

Weiying Cheng, Yoshinori Kamiyama, Keiji Tsukada

Research output: Chapter in Book/Report/Conference proceeding › Chapter

1 Citation (Scopus)

Abstract

As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.

Original language	English
Title of host publication	Electromagnetic Nondestructive Evaluation (XIX)
Publisher	IOS Press
Pages	126-133
Number of pages	8
Volume	41
ISBN (Electronic)	9781614996385
DOIs	https://doi.org/10.3233/978-1-61499-639-2-126
Publication status	Published - 2016

Publication series

Name	Studies in Applied Electromagnetics and Mechanics
Volume	41
ISSN (Print)	13837281
ISSN (Electronic)	18798322

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Keywords

back-side wall thinning
local thinning
magnetic characterization
Magnetic flux leakage testing
Magneto-Impedance sensor

ASJC Scopus subject areas

Electrical and Electronic Engineering
Mechanical Engineering

Cite this

Cheng, W., Kamiyama, Y., & Tsukada, K. (2016). Magnetic Flux Leakage Testing for Defect Characterization. In Electromagnetic Nondestructive Evaluation (XIX) (Vol. 41, pp. 126-133). (Studies in Applied Electromagnetics and Mechanics; Vol. 41). IOS Press. https://doi.org/10.3233/978-1-61499-639-2-126

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Access to Document

10.3233/978-1-61499-639-2-126