Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray

M. Kotsugi, T. Wakita, T. Taniuchi, K. Ono, M. Suzuki, N. Kawamura, MTakagaki, M. Taniguchi, K. Kobayashi, M. Oshima, N. Ishimatsu, H. Maruyama

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We demonstrate a new use for photoelectron emission microscopy (PEEM) in combination with hard X-ray synchrotron radiation. With this technique, an X-ray absorption fine structure spectrum can be acquired on each pixel in the observed image, thereby enabling analysis of the electronic properties in nanometer scale. Here, we report the local chemical composition and electronic structure of the Widmanstätten pattern in the Gibeon iron meteorite and clarify that the α lamella exhibits bcc structure with a spatially homogeneous Fe concentration.

Original languageEnglish
Pages (from-to)490-493
Number of pages4
Journale-Journal of Surface Science and Nanotechnology
Volume4
DOIs
Publication statusPublished - May 10 2006
Externally publishedYes

Keywords

  • Gibeon iron meteorite
  • Hard X-ray synchrotron radiation
  • Photoelectron emission microscope
  • Widmanstätten pattern
  • X-ray absorption fine structure

ASJC Scopus subject areas

  • Biotechnology
  • Bioengineering
  • Condensed Matter Physics
  • Mechanics of Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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  • Cite this

    Kotsugi, M., Wakita, T., Taniuchi, T., Ono, K., Suzuki, M., Kawamura, N., MTakagaki, Taniguchi, M., Kobayashi, K., Oshima, M., Ishimatsu, N., & Maruyama, H. (2006). Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray. e-Journal of Surface Science and Nanotechnology, 4, 490-493. https://doi.org/10.1380/ejssnt.2006.490