Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray

M. Kotsugi, Takanori Wakita, T. Taniuchi, K. Ono, M. Suzuki, N. Kawamura, MTakagaki, M. Taniguchi, K. Kobayashi, M. Oshima, N. Ishimatsu, H. Maruyama

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We demonstrate a new use for photoelectron emission microscopy (PEEM) in combination with hard X-ray synchrotron radiation. With this technique, an X-ray absorption fine structure spectrum can be acquired on each pixel in the observed image, thereby enabling analysis of the electronic properties in nanometer scale. Here, we report the local chemical composition and electronic structure of the Widmanstätten pattern in the Gibeon iron meteorite and clarify that the α lamella exhibits bcc structure with a spatially homogeneous Fe concentration.

Original languageEnglish
Pages (from-to)490-493
Number of pages4
Journale-Journal of Surface Science and Nanotechnology
Volume4
DOIs
Publication statusPublished - May 10 2006
Externally publishedYes

Fingerprint

Meteorites
X ray absorption
Photoelectrons
Synchrotron radiation
Electronic properties
Electronic structure
Microscopic examination
photoelectrons
Microscopes
Iron
Meteoroids
Pixels
microscopes
X-Rays
iron meteorites
electronic structure
X rays
Synchrotrons
lamella
Chemical analysis

Keywords

  • Gibeon iron meteorite
  • Hard X-ray synchrotron radiation
  • Photoelectron emission microscope
  • Widmanstätten pattern
  • X-ray absorption fine structure

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Materials Science (miscellaneous)

Cite this

Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray. / Kotsugi, M.; Wakita, Takanori; Taniuchi, T.; Ono, K.; Suzuki, M.; Kawamura, N.; MTakagaki; Taniguchi, M.; Kobayashi, K.; Oshima, M.; Ishimatsu, N.; Maruyama, H.

In: e-Journal of Surface Science and Nanotechnology, Vol. 4, 10.05.2006, p. 490-493.

Research output: Contribution to journalArticle

Kotsugi, M, Wakita, T, Taniuchi, T, Ono, K, Suzuki, M, Kawamura, N, MTakagaki, Taniguchi, M, Kobayashi, K, Oshima, M, Ishimatsu, N & Maruyama, H 2006, 'Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray', e-Journal of Surface Science and Nanotechnology, vol. 4, pp. 490-493. https://doi.org/10.1380/ejssnt.2006.490
Kotsugi, M. ; Wakita, Takanori ; Taniuchi, T. ; Ono, K. ; Suzuki, M. ; Kawamura, N. ; MTakagaki ; Taniguchi, M. ; Kobayashi, K. ; Oshima, M. ; Ishimatsu, N. ; Maruyama, H. / Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray. In: e-Journal of Surface Science and Nanotechnology. 2006 ; Vol. 4. pp. 490-493.
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