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Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1-xTiO3semiconductor
Saya Fujii, Jun Kano, Norihiro Oshime, Tohru Higuchi, Yuta Nishina, Tatsuo Fujii, Naoshi Ikeda, Hiromi Ota
Research output: Contribution to journal › Article › peer-review
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(Scopus)