TY - JOUR
T1 - Lateral inhomogeneity in the electronic structure of a conjugated poly(3-hexylthiophene) thin film
AU - Kanai, Kaname
AU - Miyazaki, Takahiro
AU - Wakita, Takanori
AU - Akaike, Kouki
AU - Yokoya, Takayoshi
AU - Ouchi, Yukio
AU - Seki, Kazuhiko
PY - 2010/7/9
Y1 - 2010/7/9
N2 - How annealing influences the morphology of a highly regioregular poly(3-hexylthiophene) (RR-P3HT) film at the substrate interface as well as the lateral inhomogeneity in the electronic structure of the film are elucidated. Whereas previous studies have reported that high-molecular-weight (MW) RR-P3HT films tend to show low crystallinity even after annealing, it is found that high-MW RR-P3HT does show high crystallinity after annealing at high temperature for a long time. Photoemission electron microscopy (PEEM), X-ray photoemission spectroscopy, and ultraviolet photoemission spectroscopy results clearly resolve a considerable lateral inhomogeneity in the morphology of RR-P3HT film, which results in a variation of the electronic structure depending on the local crystallinity. The PEEM results show how annealing facilitates crystal growth in a high-MW RR-P3HT film.
AB - How annealing influences the morphology of a highly regioregular poly(3-hexylthiophene) (RR-P3HT) film at the substrate interface as well as the lateral inhomogeneity in the electronic structure of the film are elucidated. Whereas previous studies have reported that high-molecular-weight (MW) RR-P3HT films tend to show low crystallinity even after annealing, it is found that high-MW RR-P3HT does show high crystallinity after annealing at high temperature for a long time. Photoemission electron microscopy (PEEM), X-ray photoemission spectroscopy, and ultraviolet photoemission spectroscopy results clearly resolve a considerable lateral inhomogeneity in the morphology of RR-P3HT film, which results in a variation of the electronic structure depending on the local crystallinity. The PEEM results show how annealing facilitates crystal growth in a high-MW RR-P3HT film.
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U2 - 10.1002/adfm.201000116
DO - 10.1002/adfm.201000116
M3 - Article
AN - SCOPUS:77955381027
VL - 20
SP - 2046
EP - 2052
JO - Advanced Functional Materials
JF - Advanced Functional Materials
SN - 1616-301X
IS - 13
ER -