Lateral inhomogeneity in the electronic structure of a conjugated poly(3-hexylthiophene) thin film

Kaname Kanai, Takahiro Miyazaki, Takanori Wakita, Kouki Akaike, Takayoshi Yokoya, Yukio Ouchi, Kazuhiko Seki

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

How annealing influences the morphology of a highly regioregular poly(3-hexylthiophene) (RR-P3HT) film at the substrate interface as well as the lateral inhomogeneity in the electronic structure of the film are elucidated. Whereas previous studies have reported that high-molecular-weight (MW) RR-P3HT films tend to show low crystallinity even after annealing, it is found that high-MW RR-P3HT does show high crystallinity after annealing at high temperature for a long time. Photoemission electron microscopy (PEEM), X-ray photoemission spectroscopy, and ultraviolet photoemission spectroscopy results clearly resolve a considerable lateral inhomogeneity in the morphology of RR-P3HT film, which results in a variation of the electronic structure depending on the local crystallinity. The PEEM results show how annealing facilitates crystal growth in a high-MW RR-P3HT film.

Original languageEnglish
Pages (from-to)2046-2052
Number of pages7
JournalAdvanced Functional Materials
Volume20
Issue number13
DOIs
Publication statusPublished - Jul 9 2010

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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