Laser terahertz emission microscope

Hironaru Murakami, Naotsugu Uchida, Ryotaro Inoue, Sunmi Kim, Toshihiko Kiwa, Masayoshi Tonouchi

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Developments of laser terahertz (THz) emission microscope (LTEM) systems are reviewed. Femtosecond lasers can excite the THz wave emission from various electronic materials, such as semiconductors, high-temperature superconductors, manganites, multiferroic oxides, etc., due to ultrafast current modulation. Limiting the topic to semiconductors, the current modulation is realized by acceleration or deceleration of photoexcited carriers due to the local electric field extrinsically or intrinsically induced at the laser illumination spot. Thus, LTEM has a potential to visualize the local electric field distribution and photoresponse without any contacts or damages. We have ever constructed prototype free-space type and scanning fiber-probe (SFP) type LTEM systems with transmission or reflection mode. The system performance of the SFP-LTEM has been greatly improved compared with that for the prototype one. The spatial resolution of the SFP-LTEM system has a minimum spatial resolution less than 3 mum , which is defined by the laser beam diameter. The compact SFP-LTEM system, in particular the reflection system, has the potential to be utilized for wide applications as well as various materials. In this review paper, we introduce the details of the LTEM systems and example applications for the evaluation of electric field distribution in integrated circuits and supercurrent distribution in high-temperature superconductors.

Original languageEnglish
Article number4337847
Pages (from-to)1646-1657
Number of pages12
JournalProceedings of the IEEE
Volume95
Issue number8
DOIs
Publication statusPublished - Aug 2007

Keywords

  • Femtosecond laser
  • Fiber probe
  • High-temperature superconductor
  • Microscope
  • Terahertz

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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