Isotope effects on the dissociation of a hydrogen-carbon complex in silicon

Yoichi Kamiura, Kazuhisa Fukuda, Shigeki Ohyama, Yoshifumi Yamashita

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We have found, by deep-level transient spectroscopy (DLTS), that the dissociation rate of a deuterium-carbon complex in silicon is about half that of a hydrogen-carbon complex, while the activation energies for the dissociation of both the complexes are the same. This clearly proves that both the complexes have the same atomic configuration and their dissociation is governed by the atomic jump of hydrogen (deuterium).

Original languageEnglish
Pages (from-to)1098-1099
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume39
Issue number3 A
Publication statusPublished - 2000

Fingerprint

isotope effect
Isotopes
dissociation
Deuterium
Silicon
Hydrogen
Carbon
deuterium
carbon
silicon
hydrogen
Deep level transient spectroscopy
Activation energy
activation energy
configurations
spectroscopy

Keywords

  • Carbon
  • Defect
  • Dissociation
  • DLTS
  • Hydrogen
  • Si

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Isotope effects on the dissociation of a hydrogen-carbon complex in silicon. / Kamiura, Yoichi; Fukuda, Kazuhisa; Ohyama, Shigeki; Yamashita, Yoshifumi.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 39, No. 3 A, 2000, p. 1098-1099.

Research output: Contribution to journalArticle

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