Investigation in burst pulse injection method for fault based cryptanalysis

Kengo Iokibe, Kazuhiro Maeshima, Hiroto Kagotani, Yasuyuki Nogami, Yoshitaka Toyota, Tetsushi Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper investigated about introduction of the burst pulse injection method standardized for immunity tests to a cryptanalysis using faulty ciphertexts. We investigated the potential of the burst injection method to induce faulty ciphertexts experimentally. Firstly, the standard burst pulse was injected through the power cable to a cryptographic module implementing the Advanced Encryption Standard (AES) on a field programmable gate array (FPGA). As a result, it was confirmed that the burst pulse injection might cause clock glitches on the module. Secondly, the clock glitch was varied in magnitude and timing by use of two pulse generators and transmitted to the AES circuit to clarify what types of clock glitch induce critical faulty ciphertexts suited for recovering the crypto-key successfully. Results confirmed that the clock glitch had potential to induce faulty ciphertexts when it exceeded the threshold and produced a clock interval shorter than the critical path delay in the target round. The two experimental results suggested that burst pulse injection to cryptographic modules through their power cables is a possible scenario of fault analysis attacks.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages743-747
Number of pages5
Volume2014-September
EditionSeptember
DOIs
Publication statusPublished - Sep 15 2014
Event2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States
Duration: Aug 3 2014Aug 8 2014

Other

Other2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014
CountryUnited States
CityRaleigh
Period8/3/148/8/14

Fingerprint

clocks
Clocks
bursts
injection
pulses
modules
cables
Cryptography
Cables
Pulse generators
pulse generators
field-programmable gate arrays
immunity
attack
Field programmable gate arrays (FPGA)
time measurement
intervals
thresholds
Networks (circuits)
causes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Iokibe, K., Maeshima, K., Kagotani, H., Nogami, Y., Toyota, Y., & Watanabe, T. (2014). Investigation in burst pulse injection method for fault based cryptanalysis. In IEEE International Symposium on Electromagnetic Compatibility (September ed., Vol. 2014-September, pp. 743-747). [6899067] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISEMC.2014.6899067

Investigation in burst pulse injection method for fault based cryptanalysis. / Iokibe, Kengo; Maeshima, Kazuhiro; Kagotani, Hiroto; Nogami, Yasuyuki; Toyota, Yoshitaka; Watanabe, Tetsushi.

IEEE International Symposium on Electromagnetic Compatibility. Vol. 2014-September September. ed. Institute of Electrical and Electronics Engineers Inc., 2014. p. 743-747 6899067.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Iokibe, K, Maeshima, K, Kagotani, H, Nogami, Y, Toyota, Y & Watanabe, T 2014, Investigation in burst pulse injection method for fault based cryptanalysis. in IEEE International Symposium on Electromagnetic Compatibility. September edn, vol. 2014-September, 6899067, Institute of Electrical and Electronics Engineers Inc., pp. 743-747, 2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014, Raleigh, United States, 8/3/14. https://doi.org/10.1109/ISEMC.2014.6899067
Iokibe K, Maeshima K, Kagotani H, Nogami Y, Toyota Y, Watanabe T. Investigation in burst pulse injection method for fault based cryptanalysis. In IEEE International Symposium on Electromagnetic Compatibility. September ed. Vol. 2014-September. Institute of Electrical and Electronics Engineers Inc. 2014. p. 743-747. 6899067 https://doi.org/10.1109/ISEMC.2014.6899067
Iokibe, Kengo ; Maeshima, Kazuhiro ; Kagotani, Hiroto ; Nogami, Yasuyuki ; Toyota, Yoshitaka ; Watanabe, Tetsushi. / Investigation in burst pulse injection method for fault based cryptanalysis. IEEE International Symposium on Electromagnetic Compatibility. Vol. 2014-September September. ed. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 743-747
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