Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

Fangzhun Guo, Takanori Wakita, Hiroshi Shimizu, Tomohiro Matsushita, Tuneo Yasue, Takanori Koshikawa, Ernst Bauer, Keisuke Kobayashi

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.

Original languageEnglish
Pages (from-to)S1363-S1370
JournalJournal of Physics Condensed Matter
Volume17
Issue number16
DOIs
Publication statusPublished - Apr 27 2005
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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    Guo, F., Wakita, T., Shimizu, H., Matsushita, T., Yasue, T., Koshikawa, T., Bauer, E., & Kobayashi, K. (2005). Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support. Journal of Physics Condensed Matter, 17(16), S1363-S1370. https://doi.org/10.1088/0953-8984/17/16/007