TY - JOUR
T1 - Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support
AU - Guo, Fangzhun
AU - Wakita, Takanori
AU - Shimizu, Hiroshi
AU - Matsushita, Tomohiro
AU - Yasue, Tuneo
AU - Koshikawa, Takanori
AU - Bauer, Ernst
AU - Kobayashi, Keisuke
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2005/4/27
Y1 - 2005/4/27
N2 - Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.
AB - Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.
UR - http://www.scopus.com/inward/record.url?scp=24144447631&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=24144447631&partnerID=8YFLogxK
U2 - 10.1088/0953-8984/17/16/007
DO - 10.1088/0953-8984/17/16/007
M3 - Article
AN - SCOPUS:24144447631
SN - 0953-8984
VL - 17
SP - S1363-S1370
JO - Journal of Physics Condensed Matter
JF - Journal of Physics Condensed Matter
IS - 16
ER -