Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

Fangzhun Guo, Takanori Wakita, Hiroshi Shimizu, Tomohiro Matsushita, Tuneo Yasue, Takanori Koshikawa, Ernst Bauer, Keisuke Kobayashi

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.

Original languageEnglish
JournalJournal of Physics Condensed Matter
Volume17
Issue number16
DOIs
Publication statusPublished - Apr 27 2005
Externally publishedYes

Fingerprint

Photoemission
nanotechnology
Nanotechnology
Electron microscopes
photoelectric emission
electron microscopes
Electron microscopy
electron microscopy
Magnetic lenses
Electrostatic lenses
magnetic lenses
lenses
electrostatics
filters
X rays
energy
x rays
Experiments

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support. / Guo, Fangzhun; Wakita, Takanori; Shimizu, Hiroshi; Matsushita, Tomohiro; Yasue, Tuneo; Koshikawa, Takanori; Bauer, Ernst; Kobayashi, Keisuke.

In: Journal of Physics Condensed Matter, Vol. 17, No. 16, 27.04.2005.

Research output: Contribution to journalArticle

Guo, Fangzhun ; Wakita, Takanori ; Shimizu, Hiroshi ; Matsushita, Tomohiro ; Yasue, Tuneo ; Koshikawa, Takanori ; Bauer, Ernst ; Kobayashi, Keisuke. / Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support. In: Journal of Physics Condensed Matter. 2005 ; Vol. 17, No. 16.
@article{949df733525840bc97d560e7127a9d0c,
title = "Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support",
abstract = "Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.",
author = "Fangzhun Guo and Takanori Wakita and Hiroshi Shimizu and Tomohiro Matsushita and Tuneo Yasue and Takanori Koshikawa and Ernst Bauer and Keisuke Kobayashi",
year = "2005",
month = "4",
day = "27",
doi = "10.1088/0953-8984/17/16/007",
language = "English",
volume = "17",
journal = "Journal of Physics Condensed Matter",
issn = "0953-8984",
publisher = "IOP Publishing Ltd.",
number = "16",

}

TY - JOUR

T1 - Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

AU - Guo, Fangzhun

AU - Wakita, Takanori

AU - Shimizu, Hiroshi

AU - Matsushita, Tomohiro

AU - Yasue, Tuneo

AU - Koshikawa, Takanori

AU - Bauer, Ernst

AU - Kobayashi, Keisuke

PY - 2005/4/27

Y1 - 2005/4/27

N2 - Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.

AB - Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.

UR - http://www.scopus.com/inward/record.url?scp=24144447631&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=24144447631&partnerID=8YFLogxK

U2 - 10.1088/0953-8984/17/16/007

DO - 10.1088/0953-8984/17/16/007

M3 - Article

AN - SCOPUS:24144447631

VL - 17

JO - Journal of Physics Condensed Matter

JF - Journal of Physics Condensed Matter

SN - 0953-8984

IS - 16

ER -