Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

Fangzhun Guo, Takanori Wakita, Hiroshi Shimizu, Tomohiro Matsushita, Tuneo Yasue, Takanori Koshikawa, Ernst Bauer, Keisuke Kobayashi

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELM1TEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.

Original languageEnglish
Pages (from-to)S1363-S1370
JournalJournal of Physics Condensed Matter
Issue number16
Publication statusPublished - Apr 27 2005
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics


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