Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography

Hidenori Terasaki, Satoru Urakawa, Ken Ichi Funakoshi, Yanbin Wang, Yuki Shibazaki, Takeshi Sanehira, Yasuhiro Ueda, Eiji Ohtani

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

High-pressure, high-temperature X-ray tomography experiments have been carried out using a large volume toroidal cell, which is optimized for interfacial tension measurements. A wide anvil gap, which corresponds to a field of view in the radiography imaging, was successively maintained to high pressures and temperatures using a composite plastic gasket. Obtained interfacial tensions of Ni-S liquid against Na, K-disilicate melt, were 414 and 336 mN/m at 1253 and 1293 K, respectively. Three-dimensional tomo-graphy images revealed that the sample had an irregular shape at the early stage of melting, suggesting either non-equilibrium in sample texture and force balance or partial melting of surrounding silicate. This information cannot always be obtained from two-dimensional radiographic imaging techniques. Therefore, a three-dimensional tomography measurement is appropriate for the precise interfacial measurements.

Original languageEnglish
Pages (from-to)327-334
Number of pages8
JournalHigh Pressure Research
Volume28
Issue number3
DOIs
Publication statusPublished - Sep 2008

Fingerprint

interfacial tension
tomography
liquids
melting
x rays
radiography
anvils
imaging techniques
field of view
silicates
plastics
textures
composite materials
cells

Keywords

  • Interfacial tension
  • Liquid metal
  • Toroidal cell
  • X-ray tomography

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Terasaki, H., Urakawa, S., Funakoshi, K. I., Wang, Y., Shibazaki, Y., Sanehira, T., ... Ohtani, E. (2008). Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography. High Pressure Research, 28(3), 327-334. https://doi.org/10.1080/08957950802208902

Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography. / Terasaki, Hidenori; Urakawa, Satoru; Funakoshi, Ken Ichi; Wang, Yanbin; Shibazaki, Yuki; Sanehira, Takeshi; Ueda, Yasuhiro; Ohtani, Eiji.

In: High Pressure Research, Vol. 28, No. 3, 09.2008, p. 327-334.

Research output: Contribution to journalArticle

Terasaki, H, Urakawa, S, Funakoshi, KI, Wang, Y, Shibazaki, Y, Sanehira, T, Ueda, Y & Ohtani, E 2008, 'Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography', High Pressure Research, vol. 28, no. 3, pp. 327-334. https://doi.org/10.1080/08957950802208902
Terasaki, Hidenori ; Urakawa, Satoru ; Funakoshi, Ken Ichi ; Wang, Yanbin ; Shibazaki, Yuki ; Sanehira, Takeshi ; Ueda, Yasuhiro ; Ohtani, Eiji. / Interfacial tension measurement of Ni-S liquid using high-pressure X-ray micro-tomography. In: High Pressure Research. 2008 ; Vol. 28, No. 3. pp. 327-334.
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