In situ XPS Spectra of Nonstoichiometric Fe3−δO4(100) Films

Tatsuo Fujii, Frans C. Voogt, Tjipke Hibma, George A. Sawatzky

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

XPS core- and valence-level spectra of various nonstoichiometric Fe3−δO4 films were measured systematically as a function of the δ value. The films were prepared epitaxially on MgO(100) substrates by NO2-assisted molecular beam epitaxy and characterized in situ with RHEED, LEED, and XPS. Stoichiometry of the films was controlled precisely by adjusting the NO2 pressure during deposition and analyzed ex situ by conversion electron Mössbauer spectroscopy.

Original languageEnglish
Pages (from-to)337-346
Number of pages10
JournalSurface Science Spectra
Volume6
Issue number4
DOIs
Publication statusPublished - Oct 1 1999
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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