In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O 2 atmosphere

T. Hosokai, A. Hinderhofer, A. Vorobiev, C. Lorch, T. Watanabe, T. Koganezawa, A. Gerlach, N. Yoshimoto, Y. Kubozono, F. Schreiber

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Chemical Compounds

Physics & Astronomy