In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O 2 atmosphere

T. Hosokai, A. Hinderhofer, A. Vorobiev, C. Lorch, T. Watanabe, T. Koganezawa, A. Gerlach, N. Yoshimoto, Y. Kubozono, F. Schreiber

    Research output: Contribution to journalArticlepeer-review

    13 Citations (Scopus)

    Abstract

    Structure and morphology of picene films under vacuum and O 2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O 2 atmosphere. The results provide new insights into a high hole mobility and O 2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors.

    Original languageEnglish
    Pages (from-to)34-38
    Number of pages5
    JournalChemical Physics Letters
    Volume544
    DOIs
    Publication statusPublished - Aug 20 2012

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Physical and Theoretical Chemistry

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