In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O 2 atmosphere

T. Hosokai, A. Hinderhofer, A. Vorobiev, C. Lorch, T. Watanabe, T. Koganezawa, A. Gerlach, N. Yoshimoto, Yoshihiro Kubozono, F. Schreiber

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Structure and morphology of picene films under vacuum and O 2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O 2 atmosphere. The results provide new insights into a high hole mobility and O 2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors.

Original languageEnglish
Pages (from-to)34-38
Number of pages5
JournalChemical Physics Letters
Volume544
DOIs
Publication statusPublished - Aug 20 2012

Fingerprint

X ray scattering
Vacuum
atmospheres
Thin films
vacuum
thin films
scattering
x rays
hole mobility
Organic field effect transistors
Hole mobility
synchrotrons
field effect transistors
Synchrotrons
Gases
single crystals
Single crystals
gases
picene

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Physics and Astronomy(all)

Cite this

Hosokai, T., Hinderhofer, A., Vorobiev, A., Lorch, C., Watanabe, T., Koganezawa, T., ... Schreiber, F. (2012). In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O 2 atmosphere. Chemical Physics Letters, 544, 34-38. https://doi.org/10.1016/j.cplett.2012.07.006

In situ structural characterization of picene thin films by X-ray scattering : Vacuum versus O 2 atmosphere. / Hosokai, T.; Hinderhofer, A.; Vorobiev, A.; Lorch, C.; Watanabe, T.; Koganezawa, T.; Gerlach, A.; Yoshimoto, N.; Kubozono, Yoshihiro; Schreiber, F.

In: Chemical Physics Letters, Vol. 544, 20.08.2012, p. 34-38.

Research output: Contribution to journalArticle

Hosokai, T, Hinderhofer, A, Vorobiev, A, Lorch, C, Watanabe, T, Koganezawa, T, Gerlach, A, Yoshimoto, N, Kubozono, Y & Schreiber, F 2012, 'In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O 2 atmosphere', Chemical Physics Letters, vol. 544, pp. 34-38. https://doi.org/10.1016/j.cplett.2012.07.006
Hosokai, T. ; Hinderhofer, A. ; Vorobiev, A. ; Lorch, C. ; Watanabe, T. ; Koganezawa, T. ; Gerlach, A. ; Yoshimoto, N. ; Kubozono, Yoshihiro ; Schreiber, F. / In situ structural characterization of picene thin films by X-ray scattering : Vacuum versus O 2 atmosphere. In: Chemical Physics Letters. 2012 ; Vol. 544. pp. 34-38.
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